Description and performance of the Reflection Grating Spectrometer on board of XMM-Newton

被引:5
作者
den Herder, JW [1 ]
den Boggende, AJ [1 ]
Branduardi-Raymont, G [1 ]
Brinkman, AC [1 ]
Cottam, J [1 ]
Dubbeldam, L [1 ]
Erd, C [1 ]
Guedel, M [1 ]
Kaastra, JS [1 ]
Kahn, SM [1 ]
Mewe, R [1 ]
Paerels, FB [1 ]
Rasmussen, AP [1 ]
Sakelliou, I [1 ]
Spodek, J [1 ]
Thomsen, K [1 ]
de Vries, CP [1 ]
机构
[1] Space Res Org Netherlands, NL-3584 CA Utrecht, Netherlands
来源
X-RAY OPTICS, INSTRUMENTS, AND MISSIONS III | 2000年 / 4012卷
关键词
X-ray instrumentation; reflection gratings; XMM-Newton;
D O I
10.1117/12.391546
中图分类号
V [航空、航天];
学科分类号
08 ; 0825 ;
摘要
The ESA X-ray Multi Mirror mission, XMM-Newton, carries two identical Reflection Grating. Spectrometers (RGS) behind two of its three nested sets of Welter I type mirrors. The instrument allows high-resolution (E/Delta E = 100 to 500) measurements in the soft X-ray range (6 to 38 Angstrom or 2.1 to 0.3 keV) with a maximum effective area of about 150 cm(2) at 15 Angstrom. The satellite was successfully launched on December 10, 1999, from Guyana Space Centre. Following the launch the instrument commissioning was started early in 2000. First results for the Reflection Grating Spectrometers are presented concentrating on instrumental parameters such as resolution, instrument background and CCD performance. The instrument performance is illustrated by first results from HR 1099, a non-eclipsing RS CVn binary.
引用
收藏
页码:102 / 112
页数:11
相关论文
共 7 条
[1]  
[Anonymous], COMMUNICATION
[2]   Back-illuminated CCDs developed for the reflection grating spectrometer onboard of XMM [J].
Bootsma, TMV ;
Aarts, HJM ;
vandenBerg, ML ;
Brinkman, AC ;
denBoggende, AJF ;
denHerder, JW ;
deJong, L ;
deKorte, PAJ ;
Olsthoorn, SM ;
vanZwet, EJ .
EUV, X-RAY, AND GAMMA-RAY INSTRUMENTATION FOR ASTRONOMY VII, 1996, 2808 :481-491
[3]   The reflection grating spectrometer on-board of XMM [J].
Brinkman, AC ;
Aarts, HJM ;
denBoggende, AJF ;
Bootsma, T ;
Dubbeldam, L ;
denHerder, JW ;
Kaastra, JS ;
deKorte, PAJ ;
vanLeeuwen, BJ ;
Mewe, R ;
vanZwet, E ;
Decker, T ;
Hailey, CJ ;
Kahn, SM ;
Paerels, F ;
Pratuch, S ;
Rasmussen, A ;
BranduardiRaymont, G ;
Guttridge, P ;
Bixler, J ;
Thomsen, K ;
Zehnder, A ;
Erd, C .
EUV, X-RAY, AND GAMMA-RAY INSTRUMENTATION FOR ASTRONOMY VII, 1996, 2808 :463-480
[4]  
BRINKMAN AC, 1998, P 1 XMM WORKSH VILSP
[5]  
DENBOGGENDE AJ, COMMUNICATION
[6]  
KAHN SM, 1996, SPIE, V2808
[7]  
Thomsen K., 1991, 4 EUR S SPAC ENV CON