Effect of a magnetic field in photodetachment microscopy

被引:67
作者
Chaibi, W. [1 ]
Pelaez, R. J. [1 ]
Blondel, C. [1 ]
Drag, C. [1 ]
Delsart, C. [1 ]
机构
[1] Univ Paris 11, Aime Cotton Lab, CNRS, F-91405 Orsay, France
关键词
CLOSED CLASSICAL ORBITS; CROSS-SECTION; ELECTRON-AFFINITIES; ARBITRARY ORIENTATION; QUANTUM SPECTRA; PARALLEL; IONIZATION; INTERFERENCE; ATOMS; SI;
D O I
10.1140/epjd/e2010-00086-7
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The effect of an external static magnetic field of arbitrary orientation with respect to the electric field, on the electron interference ring patterns observed by the photodetachment microscope is studied both experimentally and theoretically. The design of the interaction chamber has been modified to superimpose a controlled uniform magnetic field on the whole volume accessible to the interfering electron. Contrary to a previous study in weaker fields, where the overall dimension of the interferogram was not modified, the effect of the magnetic field here encompasses a regime of magnetic refocusing. A quantitative analysis is carried out using a closed-orbit perturbative calculation of the interference phase at the centre of the ring pattern. The essential result of this work is still the invariance of the extreme interference phase whatever the direction and magnitude of the applied magnetic field, up to values 100 times larger than in the previous experimental study. This property can be applied to revise former electron affinity measurements. Partly due to the previously unsuspected robustness of the electron interferograms vs. magnetic fields, partly thanks to the 2006 CODATA revision of the energy conversion factors, one can update the values of the electron affinities of O-16, Si-28 and S-32 to 1.4611134(9), 1.3895210(7) and 2.0771040(6) eV respectively.
引用
收藏
页码:29 / 37
页数:9
相关论文
共 33 条
[1]   The fine structure of S and S- measured with the photodetachment microscope [J].
Blondel, C ;
Chaibi, W ;
Delsart, C ;
Drag, C .
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 2006, 39 (06) :1409-1416
[2]   The electron affinities of O, Si, and S revisited with the photodetachment microscope [J].
Blondel, C ;
Chaibi, W ;
Delsart, C ;
Drag, C ;
Goldfarb, F ;
Kröger, S .
EUROPEAN PHYSICAL JOURNAL D, 2005, 33 (03) :335-342
[3]  
Blondel C, 1999, EUR PHYS J D, V5, P207, DOI 10.1007/s100530050246
[4]   Electron spectrometry at the μeV level and the electron affinities of Si and F (vol 34, pg L281, 2001) [J].
Blondel, C ;
Delsart, C ;
Goldfarb, F .
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 2001, 34 (13) :2757-2757
[5]   Electron spectrometry at the μeV level and the electron affinities of Si and F [J].
Blondel, C ;
Delsart, C ;
Goldfarb, F .
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 2001, 34 (09) :L281-L288
[6]   Physical and unphysical phases of uniformly accelerated particles [J].
Blondel, C ;
Berge, S ;
Delsart, C .
AMERICAN JOURNAL OF PHYSICS, 2001, 69 (07) :810-816
[7]   The photodetachment microscope [J].
Blondel, C ;
Delsart, C ;
Dulieu, F .
PHYSICAL REVIEW LETTERS, 1996, 77 (18) :3755-3758
[8]   THEORY OF THE PHOTODETACHMENT OF NEGATIVE-IONS IN A MAGNETIC-FIELD [J].
BLUMBERG, WAM ;
ITANO, WM ;
LARSON, DJ .
PHYSICAL REVIEW A, 1979, 19 (01) :139-148
[9]   Motion of an electron from a point source in parallel electric and magnetic fields [J].
Bracher, C ;
Delos, JB .
PHYSICAL REVIEW LETTERS, 2006, 96 (10)
[10]   Electron dynamics in parallel electric and magnetic fields [J].
Bracher, Christian ;
Kramer, Tobias ;
Delos, John B. .
PHYSICAL REVIEW A, 2006, 73 (06)