Improvement of the luminous intensity of light-emitting diodes by using highly transparent Ag-indium tin oxide p-type ohmic contacts

被引:56
|
作者
Song, JO [1 ]
Leem, DS
Kwak, JS
Park, Y
Chae, SW
Seong, TY
机构
[1] Gwangju Inst Sci & Technol, Dept Mat Sci & Engn, Kwangju 500712, South Korea
[2] Samsung Adv Inst Technol, Photon Lab, Suwon 440600, South Korea
[3] Samsung Elect Mech Co Ltd, Discrete Semiconductor Div, Suwon 443743, South Korea
关键词
Ag; GaN; indium tin oxide (ITO); light-emitting diode (LED); ohmic contact;
D O I
10.1109/LPT.2004.839783
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have investigated Ag-indium tin oxide (ITO) scheme for obtaining high-quality p-type ohmic contacts for GaN-based light-emitting diodes (LEDs). The Ag(1 nm)-ITO(200 nm) contacts exhibit greatly improved electrical characteristics when annealed at temperatures in the range 400 degreesC-600 degreesC for 1 min in air, yielding specific contact resistances of similar to10(-4) Omega(.)cm(2). In addition, the contacts give transmittance of about 96% at 460 nm, which is far better than that of the conventionally used oxidized Ni-Au contacts. It is shown that the luminous intensity of blue LEDs fabricated with the Ag-ITO contacts is about three times higher than that of LEDs with oxidized Ni-Au contacts. This result strongly indicates that the Ag-ITO scheme can serve as a highly promising p-type ohmic contact for the realization of high brightness near ultraviolet LEDs.
引用
收藏
页码:291 / 293
页数:3
相关论文
共 43 条
  • [41] Reduced Graphene Oxide/Single-Walled Carbon Nanotube Hybrid Films Using Various p-Type Dopants and Their Application to GaN-Based Light-Emitting Diodes
    Lee, Byeong Ryong
    Kim, Tae Geun
    JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2017, 17 (01) : 454 - 459
  • [42] Failure Analysis of InGaN/GaN High Power Light-Emitting Diodes Fabricated with ITO Transparent p-Type Electrode During Accelerated Electro-Thermal Stress
    Moon, Seong Min
    Kim, Y. D.
    Oh, S. K.
    Park, M. J.
    Kwak, Joon Seop
    JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2012, 12 (05) : 4177 - 4180
  • [43] Applications of Vapor-Liquid-Solid Selective Epitaxy of Highly p-type Doped 4H-SiC: PiN Diodes with Peripheral Protection and Improvement of Specific Contact Resistance of Ohmic Contacts
    Thierry-Jebali, N.
    Lazar, M.
    Vo-Ha, A.
    Carole, D.
    Souliere, V.
    Henry, A.
    Planson, D.
    Ferro, G.
    Konczewicz, L.
    Contreras, S.
    Brylinski, C.
    Brosselard, P.
    SILICON CARBIDE AND RELATED MATERIALS 2013, PTS 1 AND 2, 2014, 778-780 : 639 - +