High-energy Laue method - Importance and significance of spectometric analysis of diffracted beams

被引:5
作者
Bastie, P
Hamelin, B
Courtois, P
机构
[1] Univ Grenoble 1, UMR 5588 CNRS, Spectrometrie Phys Lab, F-38402 St Martin Dheres, France
[2] Inst Max Von Laue Paul Langevin, F-38042 Grenoble 9, France
来源
JOURNAL DE PHYSIQUE IV | 2000年 / 10卷 / P10期
关键词
D O I
10.1051/jp4:20001003
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
A detection set-up allowing the energy analysis of the diffracted beam has been implemented on the hard X ray apparatus installed at the institut Laue Langevin. First a short description of the set-up, of its characteristics and of its resolution will be given. Then. examples of improvements, related to the energy analysis, for Laue diagramm indexation, for successive diffraction order separation, for superstructure reflection studies and lattice parameter measurements will be shown. New investigation fields opened by the energy analysis of the diffracted beam will be illustrated by examples taken from several materials.
引用
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页码:21 / 26
页数:6
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