Dielectric Relaxation in Yttria-stabilized Zirconia Crystals

被引：0

作者：

Wang, Wencheng ^{[1
]}

Zhang, Peng ^{[1
]}

Li, Xiufeng ^{[1
]}

Li, Ping'an ^{[1
]}

Zhang, Hao ^{[2
]}

Zhan, Lijuan ^{[3
]}

机构：

[1] Shandong Univ Technol, Coll Elect & Elect Engn, Zibo 255000, Peoples R China

[2] Xian Univ Architecture & Technol, Funct Mat Lab, Xian 710049, Peoples R China

[3] State Grid Shandong Maintenance Co, Jinan 250000, Peoples R China

来源：

PROCEEDINGS OF 2020 INTERNATIONAL SYMPOSIUM ON ELECTRICAL INSULATING MATERIALS (ISEIM 2020) | 2020年

关键词：

YSZ; TSDC; defect dipole; dielectric relaxation; STIMULATED DEPOLARIZATION CURRENT; INTERNAL-FRICTION; CONDUCTIVITY; SIMULATION; DIFFUSION;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, the dielectric relaxation process in 11 mol% yttria-stabilized zirconia (YSZ) crystals were studied by using thermally stimulated depolarization current (TSDC) method and the origin responsible for dielectric polarization was discussed. TSDC measurements were performed in the temperature range of 173-500 K. By fitting the measured data with theoretical TSDC curves of dipole polarization, four peaks, with the activation energy of 0.46 eV, 0.99 eV, 1.15 eV, and 2.10 eV respectively, were observed. The origin for the peaks was attributed to the different migration paths of oxygen vacancies.

引用

页码：210 / 212

页数：3

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