Optical properties of monolayer transition metal dichalcogenides probed by spectroscopic ellipsometry

被引：364

作者：

Liu, Hsiang-Lin ^{[1
]}

Shen, Chih-Chiang ^{[1
]}

Su, Sheng-Han ^{[2
]}

Hsu, Chang-Lung ^{[2
]}

Li, Ming-Yang ^{[2
]}

Li, Lain-Jong ^{[2
]}

机构：

[1] Natl Taiwan Normal Univ, Dept Phys, Taipei 11677, Taiwan

[2] Acad Sinica, Inst Atom & Mol Sci, Taipei 10617, Taiwan

来源：

APPLIED PHYSICS LETTERS | 2014年 / 105卷 / 20期

关键词：

SINGLE-LAYER MOS2; VALLEY POLARIZATION; SEMICONDUCTORS; ABSORPTION; GAP;

D O I：

10.1063/1.4901836

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Spectroscopic ellipsometry was used to characterize the complex refractive index of chemical-vapor-deposited monolayer transition metal dichalcogenides (TMDs). The extraordinary large value of the refractive index in the visible frequency range is obtained. The absorption response shows a strong correlation between the magnitude of the exciton binding energy and band gap energy. Together with the observed giant spin-orbit splitting, these findings advance the fundamental understanding of their novel electronic structures and the development of monolayer TMDs-based optoelectronic and spintronic devices. (C) 2014 AIP Publishing LLC.

引用

页数：4

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