Optical properties of monolayer transition metal dichalcogenides probed by spectroscopic ellipsometry

被引:357
作者
Liu, Hsiang-Lin [1 ]
Shen, Chih-Chiang [1 ]
Su, Sheng-Han [2 ]
Hsu, Chang-Lung [2 ]
Li, Ming-Yang [2 ]
Li, Lain-Jong [2 ]
机构
[1] Natl Taiwan Normal Univ, Dept Phys, Taipei 11677, Taiwan
[2] Acad Sinica, Inst Atom & Mol Sci, Taipei 10617, Taiwan
关键词
SINGLE-LAYER MOS2; VALLEY POLARIZATION; SEMICONDUCTORS; ABSORPTION; GAP;
D O I
10.1063/1.4901836
中图分类号
O59 [应用物理学];
学科分类号
摘要
Spectroscopic ellipsometry was used to characterize the complex refractive index of chemical-vapor-deposited monolayer transition metal dichalcogenides (TMDs). The extraordinary large value of the refractive index in the visible frequency range is obtained. The absorption response shows a strong correlation between the magnitude of the exciton binding energy and band gap energy. Together with the observed giant spin-orbit splitting, these findings advance the fundamental understanding of their novel electronic structures and the development of monolayer TMDs-based optoelectronic and spintronic devices. (C) 2014 AIP Publishing LLC.
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页数:4
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