On Shear Testing of Single Crystal Ni-Base Superalloys

被引:6
作者
Eggeler, G. [1 ,2 ]
Wieczorek, N. [1 ,2 ]
Fox, F. [1 ,2 ]
Berglund, S. [1 ,2 ]
Burger, D. [1 ,2 ]
Dlouhy, A. [2 ,3 ]
Wollgramm, P. [1 ,2 ]
Neuking, K. [1 ,2 ]
Schreuer, J. [2 ,4 ]
Jacome, L. Agudo [5 ]
Gao, S. [2 ]
Hartmaier, A. [2 ]
Laplanche, G. [1 ,2 ]
机构
[1] Ruhr Univ Bochum, Inst Werkstoffe, Univ Str 150, D-44801 Bochum, Germany
[2] Ruhr Univ Bochum, Interdisciplinary Ctr Adv Mat Simulat, Univ Str 150, D-44801 Bochum, Germany
[3] ASCR, Inst Phys Mat, Zizkova 22, Brno 61662, Czech Republic
[4] Ruhr Univ Bochum, Inst Geowissensch, Univ Str 150, D-44801 Bochum, Germany
[5] Bundesanstalt Mat Forsch & Prufung BAM, Abt Werkstofftech, Unter Eichen 87, D-12205 Berlin, Germany
来源
METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE | 2018年 / 49A卷 / 09期
关键词
LOW-STRESS CREEP; HIGH-TEMPERATURE CREEP; NICKEL-BASED SUPERALLOYS; GAMMA/GAMMA'-INTERFACES; ELECTRON-MICROSCOPY; INTERNAL-STRESSES; GAMMA-PHASE; DEFORMATION; MICROSTRUCTURE; ALLOY;
D O I
10.1007/s11661-018-4726-9
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Shear testing can contribute to a better understanding of the plastic deformation of Ni-base superalloy single crystals. In the present study, shear testing is discussed with special emphasis placed on its strengths and weaknesses. Key mechanical and microstructural results which were obtained for the high-temperature (T approximate to 1000 degrees C) and low-stress (tau approximate to 200 MPa) creep regime are briefly reviewed. New 3D stereo STEM images of dislocation substructures which form during shear creep deformation in this regime are presented. It is then shown which new aspects need to be considered when performing double shear creep testing at lower temperatures (T < 800 degrees C) and higher stresses (tau > 600 MPa). In this creep regime, the macroscopic crystallographic [11-2](111) shear system deforms significantly faster than the [01-1](111) system. This represents direct mechanical evidence for a new planar fault nucleation scenario, which was recently suggested (Wu et al. in Acta Mater 144:642-655, 2018). The double shear creep specimen geometry inspired a micro-mechanical in-situ shear test specimen. Moreover, the in-situ SEM shear specimen can be FIB micro-machined from prior dendritic and interdendritic regions. Dendritic regions, which have a lower gamma' volume fraction, show a lower critical resolved shear stress.
引用
收藏
页码:3951 / 3962
页数:12
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