A CMOS temperature sensor circuit

被引:7
作者
Ohzone, Takashi [1 ]
Sadamoto, Tatsuaki
Morishita, Takayuki
Komoku, Kiyotaka
Matsuda, Toshihiro
Iwata, Hideyuki
机构
[1] Okayama Prefectural Univ, Dept Commun Engn, Soja 7191197, Japan
[2] Toyama Prefectural Univ, Dept Informat Syst Engn, Imizu 9390398, Japan
关键词
CMOS; temperature sensor; temperature dependent voltage; subthreshold current;
D O I
10.1093/ietele/e90-c.4.895
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A supply voltage (V-DD) independent temperature sensor circuit, which can be realized by the optimum combination of three current modes of n-MOSFETs including the subthreshold current using the feedback scheme from the temperature dependent voltage (V-TD) Output to the gates of three n-MOSFETs, was proposed and fabricated by a standard 1.2 mu m n-well CMOS process. The circuit consists of only 17 MOSFETs without high resistors resulting in a small die area of 0.18 mm(2). The temperature coefficient TC of the sensor circuit can be controlled by the channel length ratio L-4/L-3 of two n-MOSFETs. The average temperature sensor voltage V-TS and its typical TC are 1.77 V at V-DD = 5.0 V (20 degrees C) and 5.1 mV/degrees C for V-DD = 5.0 +/- 1.0 V in the temperature range of -20-100 degrees C in case of L-4/L-3 = 9, respectively.
引用
收藏
页码:895 / 902
页数:8
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