Influence of pulsed laser radiation on the real structure of CdTe single crystals

Back-reflection x-ray diffraction topography is used the measure the real structure of the surface layer of CdTe single crystals. It is found that the structural changes depend mainly on the laser power, on the presence of a doping impurity, and on the orientation and profile of the sample surface. Three distinct and conspicuous phenomena are discussed: overall improvement of the real structure of the surface layer, the periodic relief of the crystal surface, and twin mosaic structure. (C) 1998 American Institute of Physics.