Photothermal Measurement by the Use of Scanning Thermal Microscopy

被引：3

作者：

Bodzenta, Jerzy ^{[1
]}

Juszczyk, Justyna ^{[1
]}

Kazmierczak-Balata, Anna ^{[1
]}

Wielgoszewski, Grzegorz ^{[2
]}

机构：

[1] Silesian Tech Univ, Inst Phys, Ctr Sci & Educ, PL-44100 Gliwice, Poland

[2] Wroclaw Univ Technol, Fac Microsyst Elect & Photon, PL-50372 Wroclaw, Poland

来源：

INTERNATIONAL JOURNAL OF THERMOPHYSICS | 2014年 / 35卷 / 12期

关键词：

Finite element method; Nanothermal probe; Photothermal effect; Scanning thermal microscopy; DIFFUSIVITY; THERMOMETRY;

D O I：

10.1007/s10765-014-1613-5

中图分类号：

O414.1 [热力学];

学科分类号：

摘要：

The possibility of using the photothermal effect for generation of a temperature disturbance in quantitative thermal measurements based on utilization of a scanning thermal microscope is analyzed. It was assumed that the periodical temperature disturbance caused by absorption of intensity-modulated light can be probed by the temperature sensor of the scanning thermal microscope operating in a passive mode. To analyze the temperature field in a sample illuminated by a focused obliquely incident light beam, a numerical model of the experiment was developed using the finite element method. Numerical simulation showed that the considered measuring method potentially can provide information about the thermal properties of the sample; however, the spatial resolution of measurements will be relatively low. Experiments confirmed correctness of the developed model.

引用

页码：2316 / 2327

页数：12

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