The fast multi-frame X-ray diffraction detector at the Dynamic Compression Sector

被引：8
作者：
Sinclair, N. W. [1 ]
Turneaure, S. J. [2 ,3 ]
Wang, Y. [1 ]
Zimmerman, K. [2 ,3 ]
Gupta, Y. M. [2 ,3 ]
机构：
[1] Washington State Univ, Inst Shock Phys, Dynam Compress Sect DCS, Argonne, IL 60439 USA
[2] Washington State Univ, Inst Shock Phys, Pullman, WA 99164 USA
[3] Washington State Univ, Dept Phys, Pullman, WA 99164 USA
来源：
JOURNAL OF SYNCHROTRON RADIATION | 2021年 / 28卷 / 28期
关键词：
diffraction; shock; dynamic; compression; detector;
D O I：
10.1107/S1600577521003775
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A multi-frame, X-ray diffraction (XRD) detector system has been developed for use in time-resolved XRD measurements during single-event experiments at the Dynamic Compression Sector (DCS) at the Advanced Photon Source (APS). The system is capable of collecting four sequential XRD patterns separated by 153 ns, the period of the APS storage ring in the 24-bunch mode. This capability allows an examination of the temporal evolution of material dynamics in single-event experiments, such as plate impact experiments, explosive detonations, and split-Hopkinson pressure bar experiments. This system is available for all user experiments at the DCS. Here, the system description and measured performance parameters (detective quantum efficiency, spatial and temporal resolution, and dynamic range) are presented along with procedures for synchronization and image post-processing.
引用
收藏
页码：1216 / 1228
页数：13
相关论文
共 26 条
[1]   The Adaptive Gain Integrating Pixel Detector at theEuropean XFEL [J].
Allahgholi, Aschkan ;
Becker, Julian ;
Delfs, Annette ;
Dinapoli, Roberto ;
Goettlicher, Peter ;
Greiffenberg, Dominic ;
Henrich, Beat ;
Hirsemann, Helmut ;
Kuhn, Manuela ;
Klanner, Robert ;
Klyuev, Alexander ;
Krueger, Hans ;
Lange, Sabine ;
Laurus, Torsten ;
Marras, Alessandro ;
Mezza, Davide ;
Mozzanica, Aldo ;
Niemann, Magdalena ;
Poehlsen, Jennifer ;
Schwandt, Joern ;
Sheviakov, Igor ;
Shi, Xintian ;
Smoljanin, Sergej ;
Steffen, Lothar ;
Sztuk-Dambietz, Jolanta ;
Trunk, Ulrich ;
Xia, Qingqing ;
Zeribi, Mourad ;
Zhang, Jiaguo ;
Zimmer, Manfred ;
Schmitt, Bernd ;
Graafsma, Heinz .
JOURNAL OF SYNCHROTRON RADIATION, 2019, 26 (01) :74-82
[2]   Measurement of carbon condensates using small-angle x-ray scattering during detonation of the high explosive hexanitrostilbene [J].
Bagge-Hansen, M. ;
Lauderbach, L. ;
Hodgin, R. ;
Bastea, S. ;
Fried, L. ;
Jones, A. ;
van Buuren, T. ;
Hansen, D. ;
Benterou, J. ;
May, C. ;
Graber, T. ;
Jensen, B. J. ;
Ilavsky, J. ;
Willey, T. M. .
JOURNAL OF APPLIED PHYSICS, 2015, 117 (24)
[3]   Calibration procedures for charge-coupled device x-ray detectors [J].
Barna, SL ;
Tate, MW ;
Gruner, SM ;
Eikenberry, EF .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1999, 70 (07) :2927-2934
[4]   High-Speed Imaging at High X-ray Energy: CdTe Sensors Coupled to Charge-Integrating Pixel Array Detectors [J].
Becker, Julian ;
Tate, Mark W. ;
Shanks, Katherine S. ;
Philipp, Hugh T. ;
Weiss, Joel T. ;
Purohit, Prafull ;
Chamberlain, Darol ;
Gruner, Sol M. .
PROCEEDINGS OF THE 12TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION (SRI2015), 2016, 1741
[5]   NOISE FIGURE OF MCP IMAGE INTENSIFIER TUBE [J].
BELL, RL .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1975, 22 (10) :821-829
[6]  
Berger M., NIST, PML, DOI DOI 10.18434/T48G6X
[7]   NEW APPROACH TO NOISE FACTOR MEASUREMENT OF IMAGING DEVICES [J].
CIAMBERLINI, C ;
LONGOBARDI, G ;
RAMAZZA, PL ;
RESIDORI, S .
OPTICAL ENGINEERING, 1994, 33 (03) :845-849
[8]   Charge-coupled device area x-ray detectors [J].
Gruner, SM ;
Tate, MW ;
Eikenberry, EF .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2002, 73 (08) :2815-2842
[9]   Real-time, high-resolution x-ray diffraction measurements on shocked crystals at a synchrotron facility [J].
Gupta, Y. M. ;
Turneaure, Stefan J. ;
Perkins, K. ;
Zimmerman, K. ;
Arganbright, N. ;
Shen, G. ;
Chow, P. .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2012, 83 (12)
[10]  
Hart M, 2012, IEEE NUCL SCI CONF R, P534
123