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Spin Transport in Nondegenerate Si with a Spin MOSFET Structure at Room Temperature
被引:88
|作者:
Sasaki, Tomoyuki
[1
]
Ando, Yuichiro
[2
,3
]
Kameno, Makoto
[2
]
Tahara, Takayuki
[3
]
Koike, Hayato
[1
]
Oikawa, Tohru
[1
]
Suzuki, Toshio
[4
]
Shiraishi, Masashi
[2
,3
]
机构:
[1] TDK Corp, Adv Technol Dev Ctr, Tokyo, Japan
[2] Osaka Univ, Grad Sch Engn Sci, Suita, Osaka 565, Japan
[3] Kyoto Univ, Dept Elect Sci & Engn, Kyoto 6068501, Japan
[4] Akita Prefectural Ind Ctr, AIT, Akita, Japan
来源:
PHYSICAL REVIEW APPLIED
|
2014年
/
2卷
/
03期
基金:
日本学术振兴会;
关键词:
MINIMUM METALLIC CONDUCTIVITY;
SILICON;
SEMICONDUCTOR;
INJECTION;
SYSTEMS;
LOGIC;
D O I:
10.1103/PhysRevApplied.2.034005
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
Spin transport in nondegenerate semiconductors is expected to pave the way to the creation of spin transistors, spin logic devices, and reconfigurable logic circuits, because room-temperature (RT) spin transport in Si has already been achieved. However, RT spin transport has been limited to degenerate Si, which makes it difficult to produce spin-based signals because a gate electric field cannot be used to manipulate such signals. Here, we report the experimental demonstration of spin transport in non-degenerate Si with a spin metal-oxide-semiconductor field-effect transistor (MOSFET) structure. We successfully observe the modulation of the Hanle-type spin-precession signals, which is a characteristic spin dynamics in nondegenerate semiconductors. We obtain long spin transport of more than 20 mu m and spin rotation greater than 4 pi at RT. We also observe gate-induced modulation of spin-transport signals at RT. The modulation of the spin diffusion length as a function of a gate voltage is successfully observed, which we attribute to the Elliott-Yafet spin relaxation mechanism. These achievements are expected to lead to the creation of practical Si-based spin MOSFETs.
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页数:6
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