On-line procedure for terminating an accelerated degradation test

被引:3
作者
Yu, HF [1 ]
Tseng, ST
机构
[1] Natl Taiwan Univ Sci & Technol, Dept Ind Management, Taipei, Taiwan
[2] Natl Tsing Hua Univ, Inst Stat, Hsinchu 30043, Taiwan
关键词
accelerated degradation test (ADT); degradation path; highly reliable product; termination time;
D O I
暂无
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
Accelerated degradation testing (ADT) is a useful technique to extrapolate the lifetime of highly reliable products under normal use conditions if there exists a quality characteristic of the product whose degradation over time can be related to reliability. One practical problem arising from designing a degradation experiment is "how long should an accelerated degradation experiment last for collecting enough data to allow one to make inference about the product lifetime under the normal use condition?" In this paper, we propose an intuitively appealing procedure to determine an appropriate termination time for an ADT. Finally, we use some light-emitting diode (LED) data to demonstrate the proposed procedure.
引用
收藏
页码:207 / 220
页数:14
相关论文
共 8 条
[1]   EXPERIMENTAL-DESIGN FOR A CLASS OF ACCELERATED DEGRADATION TESTS [J].
BOULANGER, M ;
ESCOBAR, LA .
TECHNOMETRICS, 1994, 36 (03) :260-272
[2]   RELIABILITY ASSESSMENT BASED ON ACCELERATED DEGRADATION - A CASE-STUDY [J].
CAREY, MB ;
KOENIG, RH .
IEEE TRANSACTIONS ON RELIABILITY, 1991, 40 (05) :499-506
[3]   USING DEGRADATION MEASURES TO ESTIMATE A TIME-TO-FAILURE DISTRIBUTION [J].
LU, CJ ;
MEEKER, WQ .
TECHNOMETRICS, 1993, 35 (02) :161-174
[4]   A REVIEW OF RECENT RESEARCH AND CURRENT ISSUES IN ACCELERATED TESTING [J].
MEEKER, WQ ;
ESCOBAR, LA .
INTERNATIONAL STATISTICAL REVIEW, 1993, 61 (01) :147-168
[5]  
Nelson W., 1990, Accelerated testing: statistical models, test plans, and data analysis
[6]   TEMPERATURE AND CURRENT DEPENDENCE OF DEGRADATION IN RED-EMITTING GAP LEDS [J].
RALSTON, JM ;
MANN, JW .
JOURNAL OF APPLIED PHYSICS, 1979, 50 (05) :3630-3637
[7]  
Seber G. A. F., 1989, Nonlinear Regression
[8]   A termination rule for degradation experiments [J].
Tseng, ST ;
Yu, HF .
IEEE TRANSACTIONS ON RELIABILITY, 1997, 46 (01) :130-133