W-Band Characterizations of Printed Circuit Board Based on Substrate Integrated Waveguide Multi-Resonator Method

被引：41

作者：

Cheng, Yu Jian ^{[1
]}

Liu, Xiao Liang ^{[1
]}

机构：

[1] Univ Elect Sci & Technol China, EHF Key Lab Fundamental Sci, Sch Elect Engn, Chengdu 611731, Peoples R China

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 2016年 / 64卷 / 02期

关键词：

Broadband measurement; dielectric constant; loss tangent; multi-resonators method; printed circuit board (PCB); substrate integrated waveguide (SIW); COMPLEX PERMITTIVITY; TRANSMISSION-LINES; NETWORK ANALYZER; ANTENNA-ARRAY; WIDE-BAND; MICROSTRIP; CAVITIES; SYSTEMS; GHZ;

D O I：

10.1109/TMTT.2015.2511007

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper provides a broadband measurement method at W-band for printed circuit board (PCB) properties using multiple substrate integrated waveguide (SIW) resonators, i.e., SIW multi-resonator method. Eight SIW resonators are designed in series fed by a rectangular waveguide through coupling slots. All resonators operate at TE101 mode with different resonant frequencies. Multi-resonator Foster form is employed to obtain unloaded resonant frequency of each SIW cavity. After introducing the testing procedure, a number of samples based on different PCBs are fabricated and accurately measured to verify the feasibility of this method.

引用

页码：599 / 606

页数：8

共 29 条

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