Grating interferometer based scanning setup for hard x-ray phase contrast imaging

被引：79

作者：

Kottler, C. ^{[1
]}

Pfeiffer, F. ^{[1
]}

Bunk, O. ^{[1
]}

Gruenzweig, C. ^{[1
]}

David, C. ^{[1
]}

机构：

[1] Paul Scherrer Inst, CH-5232 Villigen, Switzerland

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2007年 / 78卷 / 04期

关键词：

D O I：

10.1063/1.2723064

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

In x-ray radiography, particularly for technical and industrial applications, a scanning setup is very often favorable when compared to a direct two-dimensional image acquisition. Here, we report on an efficient scanning method for grating based x-ray phase contrast imaging with tube based sources. It uses multiple line detectors for staggered acquisition of the individual phase-stepping images. We find that the total exposure time does not exceed the time needed in an equivalent scanning setup for absorption radiography. Therefore, we conclude that it should be possible to implement the method into a scanning system without affecting the scanning speed or significant increase in cost but with the advantage of providing both the phase contrast and the absorption information at once.

引用

页数：4

共 29 条

[1] AN X-RAY INTERFEROMETER [J].