Characterization of various interfaces in a TiAl-based alloy

被引：12

作者：

Gao, Xiangyu ^{[1
]}

Wang, Jie ^{[1
]}

Feng, Dan ^{[1
]}

Yang, Xiubo ^{[1
]}

Hu, Rui ^{[2
]}

Wu, Yulun ^{[2
]}

Gao, Zitong ^{[2
]}

Liu, Feng ^{[1
,2
]}

机构：

[1] Northwestern Polytech Univ, Analyt & Testing Ctr, Xian 710072, Shaanxi, Peoples R China

[2] Northwestern Polytech Univ, State Key Lab Solidificat Proc, Xian 710072, Shaanxi, Peoples R China

来源：

MATERIALS CHARACTERIZATION | 2022年 / 190卷

关键词：

Phaseboundary; Truetwin; Pseudo-twin; 120?rotationalboundary; TiAlalloy; Highresolutionelectronmicroscopy; ELECTRON-MICROSCOPY; GRAIN-REFINEMENT; DEFORMATION; RECRYSTALLIZATION; MICROSTRUCTURE; MECHANISMS; CRYSTAL; DESIGN;

D O I：

10.1016/j.matchar.2022.112056

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

As for a two phase TiAl-based alloy, gamma/alpha 2 lamellar structure has been studied, where, various atomic microstructures for interfaces generated by phase transformation and recrystallization upon high-temperature compression have been studied. As expected, mixed interfaces including phase boundary (PB), true twin (TT), pseudo-twin (PT), 120 degrees rotational boundary (RB) and large angle grain boundary (LAGB) can be observed in the as-formed structure. A detailed characterization using high resolution electron microscopy has been performed, which helps to obtaining the optimum microstructure and the corresponding excellent mechanical properties of the TiAl alloy.

引用

页数：7

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