High-aspect-ratio, ultrathick, negative-tone near-UV photoresist and its applications for MEMS

被引:469
作者
Lorenz, H [1 ]
Despont, M
Fahrni, N
Brugger, J
Vettiger, P
Renaud, P
机构
[1] Ecole Polytech Fed Lausanne, DMT IMS, CH-1015 Lausanne, Switzerland
[2] IBM Corp, Div Res, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland
关键词
high aspect ratio; negative tone; near-UV photoresists; LIGA-type applications; electroplating; photoplastic;
D O I
10.1016/S0924-4247(98)80055-1
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Detailed investigations of the limits of a new negative-tone near-UV resist (IBM SU-8) have been performed. SU-8 is an epoxy-based resist designed specifically for ultrathick, high-aspect-ratio MEMS-type applications. We have demonstrated that with single-layer coatings, thicknesses of more than 500 mu m can be achieved reproducibly. Thicker resist layers can be made by applying multiple coatings, and we have achieved exposures in 1200 mu m thick, double-coated SU-8 resist layers. We have found that the aspect ratio for near-UV (400 nm) exposed and developed structures can be greater than 18 and remains constant in the thickness range between 80 and 1200 mu m Vertical sidewall profiles result in good dimensional control over the entire resist thickness. To our knowledge, this is the highest aspect ratio reported for near-UV exposures and the given range of resist thicknesses. These results will open up new possibilities for low-cost LIGA-type processes for MEMS applications. The application potential of SU-8 is demonstrated by several examples of devices and structures fabricated by electroplating and photoplastic techniques. The latter is especially interesting as SU-8 has attractive mechanical properties. (C) 1998 Elsevier Science S.A.
引用
收藏
页码:33 / 39
页数:7
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