Spark plasma sintering and microstructural characterization of additive-free polycrystalline β-sic

被引:4
作者
Lara, A. [1 ]
Poyato, R. [1 ]
Munoz, A. [1 ]
Ortiz, A. L. [2 ]
Dominguez-Rodriguez, A. [1 ]
机构
[1] Univ Seville, Fac Fis, Dept Fis Mat Condensada, Apartado 1065, E-41012 Seville, Spain
[2] Univ Extremadura, Fac Ciencia, Dept Fis, Badajoz 06071, Spain
来源
MECHANICAL PROPERTIES OF SOLIDS XI | 2010年 / 423卷
关键词
Spark Plasma Sintering System (SPS); beta-SiC; sintering; characterization; ceramic; CONSOLIDATION; DENSIFICATION;
D O I
10.4028/www.scientific.net/KEM.423.67
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
Additive-free beta-SiC powders were sintered by means of Spark Plasma Sintering System. Experiments were performed in the temperature range from 1650 degrees C to 2200 degrees C, 3 to 10 min holding time and pressure from 50 until 150 MPa. In order to favour sinterization, the starting powder was mechanically activated: defect concentration was increased by centrifugal ball milling. Applied temperature, holding time and/or pressure were varied to analyze their effect on the densification and grain growth kinetics. The full sinterization of the material was obtained for temperatures as high as 1900 degrees C and over. The relative density of the obtained material was high, up to 97.0 +/- 0.6 % the theoretical density for 2200 degrees C sintering temperature. An intense grain growth took place while sintering. The final microstructure exhibited a grain size distribution range from 1.0 to 2.5 mu m, depending on the sintering conditions. Such grain growth strongly depends on the sintering time, not so much on the sintering temperature.
引用
收藏
页码:67 / +
页数:2
相关论文
共 12 条
  • [1] Densification mechanisms in spark plasma sintering of nanocrystalline ceramics
    Chaim, Rachman
    [J]. MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2007, 443 (1-2): : 25 - 32
  • [2] Cullity B. D., 1978, ELEMENTS XRAY DIFFRA
  • [3] Densitication of SiC by SPS-effects of time, temperature and pressure
    Guillard, Francois
    Allemand, Alexandre
    Lulewicz, Jean-Daniel
    Galy, Jean
    [J]. JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 2007, 27 (07) : 2725 - 2728
  • [4] Klug H.P., 1974, XRAY DIFFRACTION PRO, V2nd, P992
  • [5] Mittemeijer EJ., 2004, Diffraction analysis of the microstructure of materials
  • [6] Consolidation of nanostructured SiC with disorder-order transformation
    Ohyanagi, M
    Yamamoto, T
    Kitaura, H
    Kodera, Y
    Ishii, T
    Munir, ZA
    [J]. SCRIPTA MATERIALIA, 2004, 50 (01) : 111 - 114
  • [7] Crystallite sizes of LiH before and after ball milling and thermal exposure
    Ortiz, Angel L.
    Osborn, William
    Markmaitree, Tippawan
    Shaw, Leon L.
    [J]. JOURNAL OF ALLOYS AND COMPOUNDS, 2008, 454 (1-2) : 297 - 305
  • [8] Novel analytical model for the determination of grain size distributions in nanocrystalline materials with low lattice microstrains by X-ray diffractometry
    Sánchez-Bajo, F
    Ortiz, AL
    Cumbrera, FL
    [J]. ACTA MATERIALIA, 2006, 54 (01) : 1 - 10
  • [9] Analytical formulation of the variance method of line-broadening analysis for Voigtian X-ray diffraction peaks
    Sánchez-Bajo, Florentino
    Ortiz, Angel L.
    Cumbrera, Francisco L.
    [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2006, 39 : 598 - 600
  • [10] Synder R. L., 1999, DEFECT MICROSTRUCTUR