共 50 条
- [1] C-V characterization in MOS structure inversion layer including quantum mechanical effects Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 2000, 21 (01): : 1 - 7
- [3] A new method to investigate quantum mechanical effects in MOS structure strong inversion layer CHINESE JOURNAL OF ELECTRONICS, 2000, 9 (01): : 17 - 20
- [7] Analytical charge voltage model in MOS inversion layer based on space charge capacitance Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 2000, 21 (10): : 955 - 961