Deep learning-based automated optical inspection system for crimp connections

被引:2
作者
Nguyen, Huong Giang [1 ]
Meiners, Moritz [1 ]
Schmidt, Lorenz [1 ]
Franke, Joerg [1 ]
机构
[1] Friedrich Alexander Univ Erlangen Nuremberg FAU, Inst Factory Automat & Prod Syst FAPS, Nurnberg, Germany
来源
2020 10TH INTERNATIONAL ELECTRIC DRIVES PRODUCTION CONFERENCE (EDPC) | 2020年
关键词
crimp connectors; machine learning; optical inspection; quality management;
D O I
10.1109/EDPC51184.2020.9388203
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Within the trend of electrification and autonomous driving, the significance of high-quality crimp connectors is increasing as they establish the electrical connection for the energy and information flow in the automotive system. Whereas the manufacturing of crimp connectors is highly automated, the final quality assessment mainly comprises manual optical inspection tasks that are human labor-intensive and time-consuming. Addressing this gap, a computer vision system to automate the final inspection of crimp connectors is proposed and implemented. In this paper, the image processing chain and the deep learning-based model to reason over image data of crimp connectors with regard to different defect classes are outlined. The effectiveness of this system using a dataset collected in the laboratory environment is demonstrated.
引用
收藏
页码:306 / 310
页数:5
相关论文
共 16 条
  • [1] [Anonymous], 2006, STRAENFAHRZEUGE STEC, V2005, P8092
  • [2] Quality control of crimped joint contacts with conductors through thermography
    Finc, M.
    Kek, T.
    Grum, J.
    [J]. INSIGHT, 2015, 57 (05) : 257 - 265
  • [3] Finc Matej, 2012, 18 WORLD C NOND TEST
  • [4] Deep learning for visual understanding: A review
    Guo, Yanming
    Liu, Yu
    Oerlemans, Ard
    Lao, Songyang
    Wu, Song
    Lew, Michael S.
    [J]. NEUROCOMPUTING, 2016, 187 : 27 - 48
  • [5] Kabelforum, FACHB GRUNDL CRIMPT
  • [6] A survey of the recent architectures of deep convolutional neural networks
    Khan, Asifullah
    Sohail, Anabia
    Zahoora, Umme
    Qureshi, Aqsa Saeed
    [J]. ARTIFICIAL INTELLIGENCE REVIEW, 2020, 53 (08) : 5455 - 5516
  • [7] Kuhn M, 2018, IEEE VTS VEH TECHNOL, P131, DOI 10.1109/ITMC.2018.8691242
  • [8] Meiners M., 2020, 10 INT EL DRIV PROD
  • [9] Mroczkowski RS, 1995, ELECTRICAL CONTACTS - 1995: PROCEEDINGS OF THE FORTY-FIRST IEEE HOLM CONFERENCE ON ELECTRICAL CONTACTS, P154, DOI 10.1109/HOLM.1995.482867
  • [10] Prin GR, 2002, ELECTRICAL CONTACTS-2002: PROCEEDINGS OF THE FORTY-EIGHTH IEEE HOLM CONFERENCE ON ELECTRICAL CONTACTS, P246, DOI 10.1109/HOLM.2002.1040848