Heating-induced carrier accumulation in the optical confinement layer and the output power in broadened symmetric and narrow asymmetric waveguide laser diodes

被引:16
|
作者
Ryvkin, Boris [1 ]
Avrutin, Eugene
机构
[1] AF Ioffe Phys Tech Inst, St Petersburg 194021, Russia
[2] Univ York, Dept Elect, York YO10 5DD, N Yorkshire, England
关键词
D O I
10.1063/1.2749464
中图分类号
O59 [应用物理学];
学科分类号
摘要
We analyze the thermal effects in carrier accumulation (leakage) in the optical confinement layer of high-power lambda=1.06 mu m semiconductor lasers. The experimental data for the symmetric broadened-cavity lasers are analyzed to extract the information on the current dependence of the internal loss and laser temperature. These data are used to predict the thermal behavior and output power-current dependence of a proposed asymmetric nonbroadened construction operating at the same wavelength, and a significant improvement is predicted. (c) 2007 American Institute of Physics.
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页数:5
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