The Creation of the Center of Metrological Assurance of Nanotechnologies and Assessment of the Compliance of the Products of the Nano Industry

被引：0

作者：

Gusev, A. S. ^{[1
]}

Zolotarevskii, Yu. M. ^{[1
]}

Lyaskovskii, V. L. ^{[1
]}

机构：

[1] All Russia Res Inst Optophys Measurements VNIIOFI, Moscow, Russia

来源：

MEASUREMENT TECHNIQUES | 2016年 / 58卷 / 11期

关键词：

nanotechnology; metrological assurance; assessment of compliance;

D O I：

10.1007/s11018-016-0871-y

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Preconditions for the creation and process of development of the Center of Metrological Assurance and Assessment of Compliance of Nanotechnologies and the output of the nano industry are considered. The organizational structure of the Center as well as the structure and function of its regional and branch divisions are described.

引用

页码：1210 / 1213

页数：4