Observation and first-principles calculation of buried wurtzite phases in zinc-blende CdTe thin films

被引：61

作者：

Yan, Y ^{[1
]}

Al-Jassim, MM ^{[1
]}

Jones, KM ^{[1
]}

Wei, SH ^{[1
]}

Zhang, SB ^{[1
]}

机构：

[1] Natl Renewable Energy Lab, Golden, CO 80401 USA

来源：

APPLIED PHYSICS LETTERS | 2000年 / 77卷 / 10期

关键词：

D O I：

10.1063/1.1308062

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report direct observation of the existence of buried thin wurtzite CdTe layers in nominally pure zinc-blende CdTe thin films using high-resolution transmission electron microscopy. The formation of the buried wurtzite layers is a result of the formation of high density of planar defects in the zinc-blende films-the wurtzite layers are formed by closely spaced lamellar twins. First-principles calculations reveal that the presence of the buried wurtzite layers may be responsible for the poor electrical properties of the polycrystalline zinc-blende CdTe films. (C) 2000 American Institute of Physics. [S0003-6951(00)04836-1].

引用

页码：1461 / 1463

页数：3

共 19 条

[1]

Al-Jassim M. M., 1998, P 2 WORLD C PHOT SOL, P1063

[2] Dependence of CdS/CdTe thin film solar cell characteristics on the processing conditions [J].