Vibration-desensitized interferometer by continuous phase shifting with high-speed fringe capturing

被引:19
作者
Park, Jungjae [1 ]
Kim, Seung-Woo [1 ]
机构
[1] Korea Adv Inst Sci & Technol, Dept Mech Engn, Taejon 305701, South Korea
基金
新加坡国家研究基金会;
关键词
10;
D O I
10.1364/OL.35.000019
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Optical interferometers for surface metrology require high immunity to vibration when they are to be used outside the laboratory environment. Here we describe a continuous phase-shifting method as a means of vibration suppression, which implements phase shifting uninterruptedly while capturing resulting interference fringes at a high rate. The continuous phase shifting allows the interference initial phase under measurement to be locked to a single temporal frequency in captured fringes, thereby being recovered free from vibration by Fourier-based postprocessing. This continuous phase-shifting method can be realized with any phase-shifting interferometers by incorporating a high-speed digital camera with good intensity-to-voltage conversion linearity. (C) 2009 Optical Society of America
引用
收藏
页码:19 / 21
页数:3
相关论文
共 10 条
[1]   DERIVATION OF ALGORITHMS FOR PHASE-SHIFTING INTERFEROMETRY USING THE CONCEPT OF A DATA-SAMPLING WINDOW [J].
DEGROOT, P .
APPLIED OPTICS, 1995, 34 (22) :4723-4730
[2]   MULTICHANNEL PHASE-SHIFTED INTERFEROMETER [J].
KWON, OY .
OPTICS LETTERS, 1984, 9 (02) :59-61
[3]  
MALACARA D, 1992, OPTICAL SHOP TESTING, P123
[4]   Pixelated phase-mask dynamic interferometer [J].
Millerd, J ;
Brock, N ;
Hayes, J ;
North-Morris, M ;
Novak, M ;
Wyant, J .
INTERFEROMETRY XII: TECHNIQUES AND ANALYSIS, 2004, 5531 :304-314
[5]  
MILLERD JE, 2001, Patent No. 6304330
[6]   Phase-shifting birefringent scatterplate interferometer [J].
North-Morris, MB ;
VanDelden, J ;
Wyant, JC .
APPLIED OPTICS, 2002, 41 (04) :668-677
[7]   Analysis of a micropolarizer array-based simultaneous phase-shifting interferometer [J].
Novak, M ;
Millerd, J ;
Brock, N ;
North-Morris, M ;
Hayes, J ;
Wyant, J .
APPLIED OPTICS, 2005, 44 (32) :6861-6868
[8]   INSTANTANEOUS PHASE MEASURING INTERFEROMETRY [J].
SMYTHE, R ;
MOORE, R .
OPTICAL ENGINEERING, 1984, 23 (04) :361-364
[9]   FOURIER-TRANSFORM METHOD OF FRINGE-PATTERN ANALYSIS FOR COMPUTER-BASED TOPOGRAPHY AND INTERFEROMETRY [J].
TAKEDA, M ;
INA, H ;
KOBAYASHI, S .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1982, 72 (01) :156-160
[10]   Active phase-shifting interferometers for shape and deformation measurements [J].
Yamaguchi, I ;
Liu, JY ;
Kato, J .
OPTICAL ENGINEERING, 1996, 35 (10) :2930-2937