Multiple Exciton Generation in Small Si Clusters: A High-Level, Ab Initio Study

被引:39
作者
Fischer, Sean A. [1 ]
Madrid, Angeline B. [1 ]
Isborn, Christine M. [2 ]
Prezhdo, Oleg V. [1 ]
机构
[1] Univ Washington, Dept Chem, Seattle, WA 98195 USA
[2] Stanford Univ, Dept Chem, Stanford, CA 94305 USA
来源
JOURNAL OF PHYSICAL CHEMISTRY LETTERS | 2010年 / 1卷 / 01期
基金
美国国家科学基金会;
关键词
CDSE QUANTUM DOTS; CARRIER MULTIPLICATION; 1ST-PRINCIPLES CALCULATIONS; MULTIEXCITON GENERATION; PHONON BOTTLENECK; COLLOIDAL PBSE; TIME-DOMAIN; RELAXATION; EFFICIENCY;
D O I
10.1021/jz900097e
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The electron hole excitonic nature of high energy states is investigated in neutral and charged Si clusters, motivated by the multiple exciton generation (MEG) process that is highly debated in photovoltaic literature, Silicon forms the basis for-much of the photovoltaic industry, and our high-level, first principles calculations show that at 2-3 times the lowest excitation energy, the majority of optically excited states in neutral Si, and Si 10 take on multiple exciton (ME) character. The transition from single excitons (SEs) to MEs is not as sharp in Si as in PbSe clusters, but it is much more pronounced than in CdSe. The closer similarity of Si to PbSe than CdSe is unexpected, since Si clusters are less symmetric than PbSe clusters. Charging suppresses MEG in Si clusters; however, the suppression is less pronounced than in PbSe. A strong ME signal is seen already at 5 X E-g upon charging. The low ME thresholds and nearly complete switch from SEs to MEs create a good possibility for efficient MEG in neutral Si nanoclusters and reveal hope that reasonable quantum yields can still be obtained despite charging.
引用
收藏
页码:232 / 237
页数:6
相关论文
共 37 条
  • [1] Multiple exciton generation in colloidal silicon nanocrystals
    Beard, Matthew C.
    Knutsen, Kelly P.
    Yu, Pingrong
    Luther, Joseph M.
    Song, Qing
    Metzger, Wyatt K.
    Ellingson, Randy J.
    Nozik, Arthur J.
    [J]. NANO LETTERS, 2007, 7 (08) : 2506 - 2512
  • [2] Variations in the Quantum Efficiency of Multiple Exciton Generation for a Series of Chemically Treated PbSe Nanocrystal Films
    Beard, Matthew C.
    Midgett, Aaron G.
    Law, Matt
    Semonin, Octavi E.
    Ellingson, Randy J.
    Nozik, Arthur J.
    [J]. NANO LETTERS, 2009, 9 (02) : 836 - 845
  • [3] On the absence of detectable carrier multiplication in a transient absorption study of InAs/CdSe/ZnSe core/shell1/shell2 quantum dots
    Ben-Lulu, Meirav
    Mocatta, David
    Bonn, Mischa
    Banin, Uri
    Ruhman, Sanford
    [J]. NANO LETTERS, 2008, 8 (04) : 1207 - 1211
  • [4] Efficient inverse Auger recombination at threshold in CdSe nanocrystals
    Califano, M
    Zunger, A
    Franceschetti, A
    [J]. NANO LETTERS, 2004, 4 (03) : 525 - 531
  • [5] Direct and Inverse Auger Processes in InAs Nanocrystals: Can the Decay Signature of a Trion Be Mistaken for Carrier Multiplication?
    Califano, Marco
    [J]. ACS NANO, 2009, 3 (09) : 2706 - 2714
  • [6] Breaking the phonon bottleneck for holes in semiconductor quantum dots
    Cooney, Ryan R.
    Sewall, Samuel L.
    Anderson, Kevin E. H.
    Dias, Eva A.
    Kambhampati, Patanjali
    [J]. PHYSICAL REVIEW LETTERS, 2007, 98 (17)
  • [7] Highly efficient multiple exciton generation in colloidal PbSe and PbS quantum dots
    Ellingson, RJ
    Beard, MC
    Johnson, JC
    Yu, PR
    Micic, OI
    Nozik, AJ
    Shabaev, A
    Efros, AL
    [J]. NANO LETTERS, 2005, 5 (05) : 865 - 871
  • [8] Impact ionization can explain carrier multiplication in PbSe quantum dots
    Franceschetti, A.
    An, J. M.
    Zunger, A.
    [J]. NANO LETTERS, 2006, 6 (10) : 2191 - 2195
  • [9] Frisch M., 2004, GAUSSIAN 03 REVISION, DOI DOI 10.1016/J.MOLSTRUC.2017.03.014
  • [10] Structures and coalescence behavior of size-selected silicon nanoclusters studied by surface-plasmon-polariton enhanced Raman spectroscopy
    Honea, EC
    Ogura, A
    Peale, DR
    Félix, C
    Murray, CA
    Raghavachari, K
    Sprenger, WO
    Jarrold, MF
    Brown, WL
    [J]. JOURNAL OF CHEMICAL PHYSICS, 1999, 110 (24) : 12161 - 12172