Structural and optoelectronic characterization of TiO2 films prepared using the sol-gel technique

被引:63
作者
Jimenez Gonzalez, A. E. [1 ]
Gelover Santiago, S. [1 ]
机构
[1] Univ Nacl Autonoma Mexico, Ctr Invest Energia, Dept Mat Solares, Temixco 62580, Morelos, Mexico
关键词
D O I
10.1088/0268-1242/22/7/006
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
TiO2 is a versatile material that makes for fascinating study in any of its several physical forms: monocrystal, polycrystal, powder or thin film. Its enhanced photosensitivity to UV radiation and excellent chemical stability in acidic and aqueous media point to its excellent potential for use in a variety of applications, such as solar cells, electronic devices, chemical sensors and photocatalysts. Of late, thin films of TiO2 have permitted the study of physical and chemical properties that are almost impossible to examine in powders. Using the sol - gel technique, it was possible to prepare TiO2 films, and to specifically modify their characteristic properties by means of annealing treatments. Optical measurements carried out on sol - gel derived films produced results similar to those found in films prepared using the sputtering technique. The use of TiO2 films facilitates the study of the behaviour of crystalline structure, grain size, photoresponse, electrical conductivity in both darkness and light and energy band gap (E-g) as a function of treatment temperature. For the first time, it has been demonstrated that the photoconductivity of TiO2 becomes apparent at a treatment temperature of 350 degrees C, which means that below this temperature the material is not photosensitive. The photosensitivity (S) of TiO2 films prepared by the sol - gel technique reaches values between 10(0) and 10(4), surpassing by more than two orders of magnitude the photosensitivity of TiO2 in powder form. In addition, it was possible to study the surface crystalline structure, where TEM studies clearly revealed both the polycrystalline order and the atomic arrangements of the TiO2 films. Our findings will afford us an opportunity to better study the nature of TiO2 and to enhance its performance with respect to the above-mentioned applications.
引用
收藏
页码:709 / 716
页数:8
相关论文
共 42 条
  • [1] SURFACE-MORPHOLOGY EXAMINATION OF SOL-GEL DEPOSITED TIO2 FILMS
    ANAST, M
    JAMTING, A
    BELL, JM
    BENNISSAN, B
    [J]. THIN SOLID FILMS, 1994, 253 (1-2) : 303 - 307
  • [2] INFLUENCE OF SUBSTRATE ON STRUCTURAL-PROPERTIES OF TIO2 THIN-FILMS OBTAINED VIA MOCVD
    BATTISTON, GA
    GERBASI, R
    PORCHIA, M
    MARIGO, A
    [J]. THIN SOLID FILMS, 1994, 239 (02) : 186 - 191
  • [3] AL-AL2O3 INTERFACE STUDY USING SURFACE SOFT-X-RAY ABSORPTION AND PHOTOEMISSION SPECTROSCOPY
    BIANCONI, A
    BACHRACH, RZ
    HAGSTROM, SBM
    FLODSTROM, SA
    [J]. PHYSICAL REVIEW B, 1979, 19 (06): : 2837 - 2843
  • [4] BRINKER JC, 1990, SOL GEL SCI PHYS CHE, P4
  • [5] Ultrafast electron injection: Implications for a photoelectrochemical cell utilizing an anthocyanin dye-sensitized TiO2 nanocrystalline electrode
    Cherepy, NJ
    Smestad, GP
    Gratzel, M
    Zhang, JZ
    [J]. JOURNAL OF PHYSICAL CHEMISTRY B, 1997, 101 (45): : 9342 - 9351
  • [6] Synthesis of nanocrystalline photocatalytic TiO2 thin films and particles using sol-gel method modified with nonionic surfactants
    Choi, Hyeok
    Stathatos, Elias
    Dionysiou, Dionysios D.
    [J]. THIN SOLID FILMS, 2006, 510 (1-2) : 107 - 114
  • [7] Optical properties of very thin (<100nm) sol-gel TiO2 films
    Chrysicopoulou, P
    Davazoglou, D
    Trapalis, C
    Kordas, G
    [J]. THIN SOLID FILMS, 1998, 323 (1-2) : 188 - 193
  • [8] Synthesis and microstructure control of nanocrystalline titania powders via a sol-gel process
    Ding, XZ
    Liu, XH
    [J]. MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1997, 224 (1-2): : 210 - 215
  • [9] Microstructure and optical properties of TiO2 thin films prepared by low pressure hot target reactive magnetron sputtering
    Domaradzki, J.
    Kaczmarek, D.
    Prociow, E. L.
    Borkowska, A.
    Schmeisser, D.
    Beuckert, G.
    [J]. THIN SOLID FILMS, 2006, 513 (1-2) : 269 - 274
  • [10] A comparative study of the electrical properties of TiO2 films grown by high-pressure reactive sputtering and atomic layer deposition
    Dueñas, S
    Castán, H
    García, H
    San Andrés, E
    Toledano-Luque, M
    Mártil, I
    González-Díaz, G
    Kukli, K
    Uustare, T
    Aarik, J
    [J]. SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2005, 20 (10) : 1044 - 1051