Standardization of proton induced X-ray emission for analysis of trace elements in thick samples

被引：0

作者：

Zeb, Johar ^{[1
,2
]}

Ali, Shad ^{[1
,2
]}

Haneef, Muhammad ^{[1
]}

Naeem, Azhar Muhammad ^{[3
]}

Akbar, Jehan ^{[1
,4
]}

机构：

[1] Hazara Univ, Dept Phys, Front Multipurpose Hall, Mansehra 21120, Khyber Pakhtunk, Pakistan

[2] Beijing Normal Univ, Dept Phys, 19 Xinjiekou Outer St, Beijing 100875, Peoples R China

[3] Univ Punjab, Dept Elect Engn, Lahore, Pakistan

[4] Abdus Salaam Int Ctr Theoret Phys, Str Costiera 11, I-34151 Trieste, TS, Italy

来源：

CANADIAN JOURNAL OF PHYSICS | 2019年 / 97卷 / 08期

关键词：

proton induced X-ray emission; trace elements analysis; GUIPIXWIN software; NIST data; tandem Pelletron accelerator; FE-57; MOSSBAUER; PIXE ANALYSIS; EDXRF;

D O I：

10.1139/cjp-2018-0522

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

This paper presents the standardization of proton induced X-ray emission (PIXE) technique for the analysis of trace elements in thick, standard samples. Three standard reference materials, titanium, copper, and iron base alloys, were used for the study due to their availability. The proton beam was accelerated up to 2.57 MeV energy by 5UDH-II tandem Pelletron accelerator, and samples were irradiated at different geometries and durations. Spectra were acquired using a multi-channel spectrum analyzer, and spectra analyses were done using GUPIXWIN software for determination of elemental concentrations of trace elements. The obtained experimental data were compared with theoretical data and results were found to be in close agreement.

引用

页码：875 / 879

页数：5

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