Size effect on phase transition temperature of epitaxial ferroelectric films

被引：6

作者：

Zhou Zhi-Dong ^{[1
]}

Zhang Chun-Zu ^{[2
]}

Zhang Ying ^{[1
]}

机构：

[1] Xiamen Univ, Coll Mat, Dept Mat Sci & Engn, Xiamen 361005, Peoples R China

[2] Xiamen Univ, Sch Architecture & Civil Engn, Dept Civil Engn, Xiamen 361005, Peoples R China

来源：

ACTA PHYSICA SINICA | 2010年 / 59卷 / 09期

基金：

中国国家自然科学基金;

关键词：

size effect; ferroelectric thin film; phase transition temperature; boundary conditions; THICKNESS;

D O I：

10.7498/aps.59.6620

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

In this paper the phase transition temperature of epitaxial ferroelectric thin film is analyzed and discussed systematically via the dynamic Ginzburg-Landau (DGL) equation by taking the effective interior stress, surface eigenstrain relaxation and depolarization field. When the thickness of ferroelectric film is changed, external and internal factors, which affect phase transition temperature of ferroelectric thin films,are presented to explain the experimental observations. There is a good quantitative agreement between the theoretical results and experimental data for BaTiO3 thin film epitaxially grown on SrTiO3 substrate.

引用

页码：6620 / 6625

页数：6

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