On-chip sinusoidal signal generation with harmonic cancelation for analog and mixed-signal BIST applications

被引:28
作者
Barragan, Manuel J. [1 ]
Leger, Gildas [2 ]
Vazquez, Diego [2 ]
Rueda, Adoracion [2 ]
机构
[1] Univ Grenoble Alpes, TIMA Lab, CNRS, F-38031 Grenoble, France
[2] Univ Seville, Inst Microelect Sevilla, Ctr Nacl Microelect IMSE CNM CSIC, Seville 41092, Spain
关键词
On-chip signal generators; On-chip sine-wave generators; Harmonic cancellation; Analog BIST; Mixed-signal BIST; LOW THD; OSCILLATOR;
D O I
10.1007/s10470-014-0456-0
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
This work presents a technique for the on-chip generation of analog sinusoidal signals with high spectral quality and reduced circuitry resources. The proposed generation technique consists of a modified low-order analog filter, that provides a sinusoidal output as response to a DC input, combined with a harmonic cancellation strategy to improve the linearity of the generated signal. The proposed generator has the attributes of digital programming and control, low area overhead, and low design effort, which make this approach very suitable as test stimulus generator for built-in test applications. An integrated prototype designed in a 180 nm CMOS technology is presented in order to show the feasibility of the technique. Results obtained from the prototype show a THD around dB.
引用
收藏
页码:67 / 79
页数:13
相关论文
共 18 条
[1]   Low THD bandpass-based oscillator using multilevel hard limiter [J].
Bahmani, F. ;
Sanchez-Sinencio, E. .
IET CIRCUITS DEVICES & SYSTEMS, 2007, 1 (02) :151-160
[2]  
Barragan M. J., 2013, IEEE 4 LAT AM S CIRC, P1, DOI [10.1109/LASCAS.2013.6519084, DOI 10.1109/LASCAS.2013.6519084]
[3]   Analog Sinewave Signal Generators for Mixed-Signal Built-in Test Applications [J].
Barragan, Manuel J. ;
Vazquez, Diego ;
Rueda, Adoracion .
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2011, 27 (03) :305-320
[4]   A 1-MHz area-efficient on-chip spectrum analyzer for analog testing [J].
Dominguez, M. A. ;
Ausin, J. L. ;
Duque-Carrillo, J. F. ;
Torelli, G. .
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2006, 22 (4-6) :437-448
[5]   On-chip analog signal generation for mixed-signal built-in self-test [J].
Dufort, B ;
Roberts, GW .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1999, 34 (03) :318-330
[6]   A Low THD, Low Power, High Output-Swing Time-Mode-Based Tunable Oscillator Via Digital Harmonic-Cancellation Technique [J].
Elsayed, Mohamed M. ;
Sanchez-Sinencio, Edgar .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2010, 45 (05) :1061-1071
[7]  
Eunyoung Seok, 2008, 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers, P472
[8]  
Laker J. R., 1994, Design of Analog Integrated Circuits and Systems
[9]   Accurate digital synthesis of sinewaves [J].
Lampasi, Domenico Alessandro ;
Moschitta, Antonio ;
Carbone, Paolo .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2008, 57 (03) :522-529
[10]  
Maeda A., 2008, 2008 IEEE International Test Conference, P1, DOI DOI 10.1109/TEST.2008.4700607