Frequency Response Technique to Recognize Turn-to-Turn Insulation Deterioration in Transformer Winding

被引:0
|
作者
Bagheri, Mehdi [1 ]
Stojcevski, Blagojce [1 ]
Phung, B. T. [2 ]
机构
[1] Nazarbayev Univ, Sch Engn, Dept Elect Engn, Astana 010000, Kazakhstan
[2] Univ New South Wales, Sch EE&T, Sydney, NSW 2052, Australia
关键词
frequency response analysis; transformer inter-turn fault; insulation degradation;
D O I
暂无
中图分类号
X [环境科学、安全科学];
学科分类号
08 ; 0830 ;
摘要
One of the most important failure issues in transformers is the turn-to-turn short circuit fault. Turn-to-turn fault can be occurred due to the inter-turn paper insulation deterioration, or due to removing thin layer coated insulation between the winding turns. To date, there is no specific pre-determined method to find (or at least suspect) a deteriorated turn-to-turn insulation medium before catastrophic failure. Frequency Response Analysis (FRA) as a method introduced for transformer mechanical defect recognition, may be able to recognize the turn-to-turn fault potential and assist on this case. Hence, this study has concentrated practically on FRA capability to find turn-to-turn insulation degradation as well as inter-turn aging rate. To this end, two different test objects are used and FRA signatures in various conditions are recorded. FRA results are provided and technically discussed.
引用
收藏
页码:105 / 109
页数:5
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