Frustration effect on escape rate in Josephson junctions between single-band and three-band superconductors in the macroscopic quantum tunneling regime

被引：4
|
作者：
Askerzade, I. N. [1 ,2 ,3 ]
Aydin, A. [1 ,2 ]
机构：
[1] Ankara Univ, Dept Comp Engn, TR-06100 Ankara, Turkey
[2] Ankara Univ, Ctr Excellence Supercond Res, TR-06100 Ankara, Turkey
[3] Azerbaijan Natl Acad Sci, Inst Phys, AZ-1143 Baku, Azerbaijan
来源：
LOW TEMPERATURE PHYSICS | 2021年 / 47卷 / 04期
关键词：
Josephson junctions; quantum tunneling; single-band and three-band superconductors; UPPER CRITICAL-FIELD; ZERO-VOLTAGE STATE; TEMPERATURE; SYMMETRY;
D O I：
10.1063/10.0003738
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The escape rate of S -> R switching (from superconducting S state to resistive R state) in Josephson junction formed by s-wave single-band (SB) and three-band (ThB) superconductors (SB/ThB junctions) in macroscopic quantum tunneling regime is investigated. We use the effective critical current approximation in SB/ThB junctions. It was shown that escape rate can exhibit qualitative features in the case of frustration effects in ThB superconductors. Inclusion of Leggett modes in ThB superconductors leads to enhancement of escape rate in three-channel Josephson junction in comparison with single-channel junctions.
引用
收藏
页码：282 / 286
页数：5
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