Nanocrack nucleation in polycrystalline silicon during grain-boundary sliding

被引:3
作者
Ovid'ko, I. A. [1 ]
Sheinerman, A. G. [1 ]
机构
[1] Russian Acad Sci, Inst Problems Mech Engn, St Petersburg 199178, Russia
关键词
D O I
10.1134/S1063783407060157
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
A theoretical model is proposed to describe nanocrack nucleation in polycrystalline silicon. In terms of this model, nanocrack nucleation is stimulated by grain-boundary sliding, which creates sources of local stresses in triple,junctions of grain boundaries. The relaxation of these local stresses is the main driving force of nanocrack nucleation near triple Junctions in polycrystal line silicon, in which grain-boundary sliding C, contributes substantially to plastic deformation under cyclic loading at room temperature. The model is used to calculate the critical external stress required for nanocrack nucleation in polycrystalline silicon.
引用
收藏
页码:1111 / 1115
页数:5
相关论文
共 22 条
  • [1] [Anonymous], 1972, THEORY DISLOCATIONS
  • [2] Structure, impurity composition, and photoluminescence of mechanically polished layers of single-crystal silicon
    Batalov, RI
    Bayazitov, RM
    Khusnullin, NM
    Terukov, EI
    Kudoyarova, VK
    Mosina, GN
    Andreev, BA
    Kryzhkov, DI
    [J]. PHYSICS OF THE SOLID STATE, 2005, 47 (01) : 1 - 4
  • [3] Electronic properties of silicon with ultrasmall germanium clusters
    Brudnyi, VN
    Grinyaev, SN
    Dvurechenskii, AV
    [J]. PHYSICS OF THE SOLID STATE, 2005, 47 (11) : 2020 - 2024
  • [4] On the grain size softening in nanocrystalline materials
    Conrad, H
    Narayan, J
    [J]. SCRIPTA MATERIALIA, 2000, 42 (11) : 1025 - 1030
  • [5] Mechanical fatigue of polysilicon: Effects of mean stress and stress amplitude
    Kahn, H
    Chen, L
    Ballarini, R
    Heuer, AH
    [J]. ACTA MATERIALIA, 2006, 54 (03) : 667 - 678
  • [6] Dynamic fatigue of silicon
    Kahn, H
    Ballarini, R
    Heuer, AH
    [J]. CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE, 2004, 8 (01) : 71 - 76
  • [7] Longitudinal-phonon relaxation mechanisms in cubic crystals of germanium, silicon, and diamond
    Kuleev, IG
    Kuleev, II
    [J]. PHYSICS OF THE SOLID STATE, 2005, 47 (02) : 312 - 323
  • [8] Deformation of electrodeposited nanocrystalline nickel
    Kumar, KS
    Suresh, S
    Chisholm, MF
    Horton, JA
    Wang, P
    [J]. ACTA MATERIALIA, 2003, 51 (02) : 387 - 405
  • [9] A reaction-layer mechanism for the delayed failure of micron-scale polycrystalline silicon structural films subjected to high-cycle fatigue loading
    Muhlstein, CL
    Stach, EA
    Ritchie, RO
    [J]. ACTA MATERIALIA, 2002, 50 (14) : 3579 - 3595
  • [10] Electronic structure of Si(001)-c(4 x 2) analyzed by scanning tunneling spectroscopy and ab initio simulations -: art. no. 035330
    Nakayama, KS
    Alemany, MMG
    Sugano, T
    Ohmori, K
    Kwak, H
    Chelikowsky, JR
    Weaver, JH
    [J]. PHYSICAL REVIEW B, 2006, 73 (03)