Nanostructuration and band gap emission enhancement of ZnO film via electrochemical anodization

被引:19
作者
Achour, A. [1 ]
Soussou, M. A. [2 ,3 ]
Aissa, K. Ait [4 ]
Islam, M. [5 ]
Barreau, N. [4 ]
Faulques, E. [4 ]
Le Brizoual, L. [6 ]
Djouadi, M. A. [4 ]
Boujtita, M. [7 ]
机构
[1] CNRS, LAAS, F-31400 Toulouse, France
[2] Univ Gabes, LaPhyMNE, Zrig 6072, Gabes, Tunisia
[3] Univ Poitiers, IC2MP, UMR 7285, F-86022 Poitiers, France
[4] Univ Nantes, CNRS, Inst Mat Jean Rouxel, F-44322 Nantes 3, France
[5] King Saud Univ, Coll Engn, Riyadh 11421, Saudi Arabia
[6] Univ Rennes 1, Inst Elect & Telecommun, CNRS, IETR UMR 6164, F-35042 Rennes, France
[7] Univ Nantes, CEISAM, CNRS, F-44322 Nantes 3, France
关键词
Zinc oxide; Thin films; Anodic oxidation; Photoluminescence; Band gap emission; ZINC-OXIDE; THIN-FILMS; AQUEOUS-ELECTROLYTES; CARBON NANOTUBES; LOW-TEMPERATURE; XPS; DISSOLUTION; PHOTOLUMINESCENCE; RELAXATION; ELECTRODES;
D O I
10.1016/j.tsf.2014.10.061
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report fabrication of nanostructured zinc oxide (ZnO) thin films with improved optical properties through electrochemical anodization. The ZnO filmswere produced over silicon substrates via radio-frequency (RF) plasma magnetron sputtering technique followed by electrochemical treatment in potassium sulfate solution. After electrochemical treatment, the effect of applied potential on the band gap emission behavior of ZnO films was investigated for the potential drop of 1.8, 2.4 and 3.0 V against reference electrode of Ag/AgCl/0.1MKCl. Depending on these values, ZnO films with different degrees of nonporous morphology, improved structural quality and oxygen-rich surface chemistrywere obtained. The treatment also resulted in enhancement of band gap emission from ZnO films with the degree of enhancement depending on the applied potential. As compared to the asdeposited films, a maximum increase in the photoemission intensity by more than 2.2 times was noticed. In this paper, any changes in the structure, surface chemistry and band gap emission intensity of the RF sputter deposited films, as induced by the anodization treatment at differential potential values, are discussed. (C) 2014 Elsevier B.V. All rights reserved.
引用
收藏
页码:168 / 174
页数:7
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