Magnetic manipulation of a microcantilever for a new concept in atomic force microscopy

被引：0
|
作者：
Lee, Sang Heon [1 ]
Jung, Kwang Suk
机构：
[1] Andong Natl Univ, Sch Mech Engn, Kyungbuk 760749, South Korea
[2] Chungju Natl Univ, Dept Mech Engn, Chungbuk 380702, South Korea
来源：
IEEE TRANSACTIONS ON MAGNETICS | 2007年 / 43卷 / 06期
关键词：
atomic force microscopy (AFM); electromagnetic forces; hinged microcantilever;
D O I：
10.1109/TMAG.2007.893869
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Magnetic manipulation of a microcantilever for a new concept in atomic force microscopy, which is able to adjust the stiffness of microcantilever and do simultaneous imaging and manipulation of living cell, is presented. With the data of the appropriate magnetic force for operation, the magnetic elements are designed using a magnetic analysis program. The experimental results show that the design process is valid, and the precise manipulation of microcantilever is feasible.
引用
收藏
页码：2737 / 2739
页数：3
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