Strength distribution of single-crystal silicon theta-like specimens
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作者:
Gaither, Michael S.
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Natl Inst Stand & Technol, Div Ceram, Mat Sci & Engn Lab, Gaithersburg, MD 20899 USANatl Inst Stand & Technol, Div Ceram, Mat Sci & Engn Lab, Gaithersburg, MD 20899 USA
Gaither, Michael S.
[1
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DelRio, Frank W.
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Natl Inst Stand & Technol, Div Ceram, Mat Sci & Engn Lab, Gaithersburg, MD 20899 USANatl Inst Stand & Technol, Div Ceram, Mat Sci & Engn Lab, Gaithersburg, MD 20899 USA
DelRio, Frank W.
[1
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Gates, Richard S.
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Natl Inst Stand & Technol, Div Ceram, Mat Sci & Engn Lab, Gaithersburg, MD 20899 USANatl Inst Stand & Technol, Div Ceram, Mat Sci & Engn Lab, Gaithersburg, MD 20899 USA
Gates, Richard S.
[1
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Fuller, Edwin R., Jr.
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Natl Inst Stand & Technol, Div Ceram, Mat Sci & Engn Lab, Gaithersburg, MD 20899 USANatl Inst Stand & Technol, Div Ceram, Mat Sci & Engn Lab, Gaithersburg, MD 20899 USA
Fuller, Edwin R., Jr.
[1
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Cook, Robert F.
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Natl Inst Stand & Technol, Div Ceram, Mat Sci & Engn Lab, Gaithersburg, MD 20899 USANatl Inst Stand & Technol, Div Ceram, Mat Sci & Engn Lab, Gaithersburg, MD 20899 USA
Cook, Robert F.
[1
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机构:
[1] Natl Inst Stand & Technol, Div Ceram, Mat Sci & Engn Lab, Gaithersburg, MD 20899 USA
A new test specimen was developed for micro-scale tensile strength measurements, allowing direct assessment of surface effects on strength. Specimens were formed by deep reactive ion etching, tested with instrumented indentation, and test results interpreted using finite element analyses. Fracture strengths as great as 3 GPa were observed, with fracture initiating at processing-induced flaws and propagating along {1 1 1} and {1 1 0} planes. Published by Elsevier Ltd. on behalf of Acta Materialia Inc.
机构:
NIST, Mat Measurement Sci Div, Mat Measurement Lab, Gaithersburg, MD 20899 USANIST, Mat Measurement Sci Div, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Gaither, Michael S.
Gates, Richard S.
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NIST, Mat Measurement Sci Div, Mat Measurement Lab, Gaithersburg, MD 20899 USANIST, Mat Measurement Sci Div, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Gates, Richard S.
Kirkpatrick, Rebecca
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NIST, Mat Measurement Sci Div, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Penn State Univ, University Pk, PA 16802 USANIST, Mat Measurement Sci Div, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Kirkpatrick, Rebecca
Cook, Robert F.
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h-index: 0
机构:
NIST, Mat Measurement Sci Div, Mat Measurement Lab, Gaithersburg, MD 20899 USANIST, Mat Measurement Sci Div, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Cook, Robert F.
DelRio, Frank W.
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h-index: 0
机构:
NIST, Mat Measurement Sci Div, Mat Measurement Lab, Gaithersburg, MD 20899 USANIST, Mat Measurement Sci Div, Mat Measurement Lab, Gaithersburg, MD 20899 USA
机构:
Natl Res Tomsk State Univ, Tomsk, Russia
Tomsk State Univ, VD Kuznetsov Siberian Phys Tech Inst, Tomsk, RussiaNatl Res Tomsk State Univ, Tomsk, Russia
机构:
Hughes Aircraft Co, Electroopt Syst Components & Mat Ctr, El Segundo, CA 90245 USAHughes Aircraft Co, Electroopt Syst Components & Mat Ctr, El Segundo, CA 90245 USA