Highly Conductive p-Type Silicon Carbon Alloys Deposited by Hot-Wire Chemical Vapor Deposition

被引:15
作者
Chen, Tao [1 ,2 ]
Yang, Deren [1 ]
Carius, Reinhard [2 ]
Finger, Friedhelm [2 ]
机构
[1] Zhejiang Univ, State Key Lab Silicon Mat, Hangzhou 310027, Zhejiang, Peoples R China
[2] Forschungszentrum Julich, Photovolta IEF 5, D-52425 Julich, Germany
关键词
LOW-TEMPERATURE DEPOSITION; RAMAN-SCATTERING; CARBIDE FILMS; SUBSTRATE TEMPERATURES; WINDOW LAYERS; N-TYPE; HWCVD; FILAMENT;
D O I
10.1143/JJAP.49.041303
中图分类号
O59 [应用物理学];
学科分类号
摘要
P-type microcrystalline silicon carbide (mu c-SiC:H) alloys for application as a window layer in silicon based thin film solar cells were grown by hot-wire chemical vapor deposition using hydrogen diluted monomethylsilane and trimethylaluminum. Conductivities up to 0.1 S/cm were obtained for p-type material. The optical properties were studied by photothermal deflection spectroscopy. At photon energies below 1.25 eV, both free carrier and defect absorption lead to a high absorption coefficient. For photon energies >2.0 eV, the absorption coefficient is affected by the crystallinity and the structural composition. The structure of Al-doped mu c-SiC:H thin films were investigated by infrared and Raman spectroscopy. It was found that increase of the deposition pressure can compensate for the loss of crystallinity caused by Al-doping. At high deposition pressure (>100 Pa), increasing contributions of hexagonal SiC alloys, and separated carbon phases are observed. (C) 2010 The Japan Society of Applied Physics
引用
收藏
页码:0413031 / 0413036
页数:6
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