Origin of Device Performance Enhancement of Junctionless Accumulation-Mode (JAM) Bulk FinFETs With High-κ Gate Spacers

被引:40
作者
Choi, Ji Hun [1 ]
Kim, Tae Kyun [1 ]
Moon, Jung Min [1 ]
Yoon, Young Gwang [1 ]
Hwang, Byeong Woon [1 ]
Kim, Dong Hyun [1 ]
Lee, Seok-Hee [1 ]
机构
[1] Korea Adv Inst Sci & Technol, Dept Elect Engn, Taejon 305701, South Korea
关键词
Fringing field; high-kappa gate spacers; JAM FET; junctionless (JL) FET; TRANSISTOR;
D O I
10.1109/LED.2014.2364093
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this letter, we investigated the junctionless accumulation-mode (JAM) bulk FinFETs with high-kappa gate spacers showing enhanced device performance in SS, DIBL, and ON/OFF current ratio. We found that origin of the ON-state current enhancement was reduction of the initial energy barrier between the source and channel, and reason for the OFF-state current reduction was L-G extension caused by the fringing field through high-kappa gate spacers. The OFF-state leakage current decreased by over one order of magnitude. The ON-state current was remarkably enhanced by 180% over that of low-kappa gate spacers. The high-kappa gate spacer is indispensable for enhancing the performance of the JAM field-effect transistor in a sub 20-nm -gate length regime.
引用
收藏
页码:1182 / 1184
页数:3
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