A comparative study on the performance of 1S-1R and Complementary resistive switching models

被引:0
作者
Jagath, Arya Lekshmi [1 ]
Kumar, T. Nandha [1 ]
机构
[1] Univ Nottingham, Dept Elect & Elect Engn, Malaysia Campus, Semenyih, Selangor, Malaysia
来源
2020 IEEE INTERNATIONAL CONFERENCE ON SEMICONDUCTOR ELECTRONICS (ICSE 2020) | 2020年
关键词
Resistive Random-Access Memory; 1S-1R; complementary resistive switching; sneak path current; readout margin; DEVICE; SELECTOR;
D O I
10.1109/icse49846.2020.9166874
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Two prominent engineering solutions to mitigate sneak path current in Resistive random-access memory (RRAM) based cross bar arrays are a) one selector-one resistor (1S-1R) design and b) complementary resistive switching (CRS) device design. This paper presents the implementation and comparison of electrical models of 1S-1R as well as CRS device in 2x2 crossbar array and demonstrate the amount of sneak path current eliminated by both designs. To simulate the circuits, three write schemes are adopted such as floating, V/2 as well as V/3, with pulses of amplitude 4-4.5 V is applied to the selected cell for data write and 2-2.3 V is applied to perform read from the selected cell. In 1S-1R array, an initial SET pulse has been applied to obtain worst case state condition whereas in CRS device design, instead of applying initial SET pulses, an additional write back signal is applied to compensate for destructive read-0 process. From the simulation results, it has been revealed that write schemes such as floating and V/3 schemes are efficient to be used in CRS and 1S-1R memory designs. In V/3 scheme, the sneak path current originated during read process in 1S-1R based array is reduced by 96% whereas for CRS array shows 93% of reduction. Hence, it can be concluded that 1S-1R design outweigh CRS in mitigating the sneak path current in low dimension memory arrays.
引用
收藏
页码:9 / 12
页数:4
相关论文
共 22 条
  • [1] Ambrogio S, 2014, PROC EUR S-STATE DEV, P242, DOI 10.1109/ESSDERC.2014.6948805
  • [2] Cassuto Y, 2013, IEEE INT SYMP INFO, P156, DOI 10.1109/ISIT.2013.6620207
  • [3] Trilayer Tunnel Selectors for Memristor Memory Cells
    Choi, Byung Joon
    Zhang, Jiaming
    Norris, Kate
    Gibson, Gary
    Kim, Kyung Min
    Jackson, Warren
    Zhang, Min-Xian Max
    Li, Zhiyong
    Yang, J. Joshua
    Williams, R. Stanley
    [J]. ADVANCED MATERIALS, 2016, 28 (02) : 356 - 362
  • [4] Crossbar array of selector-less TaOx/TiO2 bilayer RRAM
    Chou, Chun-Tse
    Hudec, Boris
    Hsu, Chung-Wei
    Lai, Wei-Li
    Chang, Chih-Cheng
    Hou, Tuo-Hung
    [J]. MICROELECTRONICS RELIABILITY, 2015, 55 (11) : 2220 - 2223
  • [5] Modeling of bipolar resistive switching of a nonlinear MISM memristor
    Hatem, Firas Odai
    Ho, Patrick W. C.
    Kumar, T. Nandha
    Almurib, Haider A. F.
    [J]. SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2015, 30 (11)
  • [6] Developing a Low Cost, Portable Jammer Detection and Localization Device for First Responders
    Jagannath, Anu
    Jagannath, Jithin
    Sheaffer, Brendan
    Drozd, Andrew
    [J]. 2019 16TH IEEE ANNUAL CONSUMER COMMUNICATIONS & NETWORKING CONFERENCE (CCNC), 2019,
  • [7] Insight into physics-based RRAM models - review
    Jagath, Arya Lekshmi
    Leong, Chee Hock
    Kumar, T. Nandha
    Almurib, Haider A. F.
    [J]. JOURNAL OF ENGINEERING-JOE, 2019, 2019 (07): : 4644 - 4652
  • [8] Modeling of Current Conduction During RESET Phase of Pt/Ta2O5/TaOx/Pt Bipolar Resistive RAM Devices
    Jagath, Arya Lekshmi
    Kumar, T. Nandha
    Almurib, Haider A. F.
    [J]. 2018 7TH IEEE NON-VOLATILE MEMORY SYSTEMS AND APPLICATIONS SYMPOSIUM (NVMSA 2018), 2018, : 55 - 60
  • [9] Crossbar RRAM Arrays: Selector Device Requirements During Write Operation
    Kim, Sungho
    Zhou, Jiantao
    Lu, Wei D.
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2014, 61 (08) : 2820 - 2826
  • [10] Kumar TN, 2014, 2014 IEEE ASIA PACIFIC CONFERENCE ON CIRCUITS AND SYSTEMS (APCCAS), P703, DOI 10.1109/APCCAS.2014.7032878