High cumulants in the counting statistics measured for a quantum dot

被引：26
|
作者：
Fricke, Christian [1 ]
Hohls, Frank [1 ]
Flindt, Christian [2 ]
Haug, Rolf J. [1 ]
机构：
[1] Leibniz Univ Hannover, Inst Festkorperphys, D-30167 Hannover, Germany
[2] Harvard Univ, Dept Phys, Cambridge, MA 02138 USA
来源：
PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES | 2010年 / 42卷 / 04期
关键词：
Single electron tunneling; Quantum dot; Full counting statistics; Cumulants; OXIDATION;
D O I：
10.1016/j.physe.2009.11.112
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
We report on measurements of single electron tunneling through a quantum dot using a quantum point contact as non-invasive charge detector with fast time response. We elaborate on the unambiguous identification of individual tunneling events and determine the distribution of transferred charges, the so-called full counting statistics. We discuss our data analysis, including the error estimates of the measurement, and show that the quality of our experimental results is sufficiently high to extract cumulants of the distribution up to the 20th order for short times. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码：848 / 851
页数：4
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