Snap-through and pull-in instabilities of an arch-shaped beam under an electrostatic loading

被引:105
作者
Zhang, Yin [1 ]
Wang, Yisong
Li, Zhihong
Huang, Yubo
Li, Dachao
机构
[1] Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech, Beijing 100080, Peoples R China
[2] Peking Univ, Inst Microelect, Netl Key Lab Nano Micro Fabricat Technol, Beijing 100871, Peoples R China
[3] Peking Univ, Inst Microelect, MEMS Ctr, Beijing 100871, Peoples R China
[4] Tianjin Univ, State Key Lab Precis Measuring Technol & Instrume, Tianjin 300072, Peoples R China
[5] Tianjin Univ, Coll Precis Instrument & Optoelect Engn, Tianjin 300072, Peoples R China
基金
中国国家自然科学基金;
关键词
actuators; beams; electrostatic analysis; modeling;
D O I
10.1109/JMEMS.2007.897090
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The snap-through and pull-in instabilities of the micromachined arch-shaped beams under an electrostatic loading are studied both theoretically and experimentally. The pull-in instability that results in a system collision with an electrode substrate may lead to a system failure and, thus, limits the system maximum displacement. The beam/plate structure with a flat initial configuration under an electrostatic loading can only experience the pull-in instability. With the different arch configurations, the structure may experience either only the pull-in instability or the snap-through and pull-in instabilities together. As shown in our computation and experiment, those arch-shaped beams with the snap-through instability have the larger maximum displacement compared with the arch-shaped beams with only the pull-in stability and those with the flat initial configuration. The snap-through occurs by exerting a fixed load, and the structure experiences a discontinuous displacement jump without consuming power. Furthermore, after the snap-through jump, the structures are demonstrated to have the capacity to withstand further electrostatic loading without pull-in. Those properties of consuming no power and increasing the structure deflection range without pull-in is very useful in microelectromechanical systems design, which can offer better sensitivity and tuning range.
引用
收藏
页码:684 / 693
页数:10
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