Three-dimensional micro-XRF investigations of paint layers with a tabletop setup

被引：120
作者：
Kanngiesser, B
Malzer, W
Rodriguez, AF
Reiche, I
机构：
[1] Tech Univ Berlin, Inst Atomare Phys & Fachdidaktik, D-10623 Berlin, Germany
[2] CNRS, UMR 171, Lab C2RMF, F-75001 Paris, France
来源：
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 2005年 / 60卷 / 01期
关键词：
tabletop 3D micro-XRF; confocal setup; depth profiling; paint layers;
D O I：
10.1016/j.sab.2004.10.012
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
The non-destructive investigation of art and archaeological objects with depth sensitivity is now possible using 3D micro-XRF spectroscopy. More detailed answers for questions on painting techniques, on the pigment palette, on the production processes and indirectly on dating or provenancing of objects are accessible now. This was already illustrated by the investigation of Mughal miniatures with a confocal setup at the synchrotron source BESSY. In this paper we demonstrate the feasibility of 3D micro-XRF spectroscopy with a tabletop setup and discuss its sensitivity in comparison to the synchrotron-based setup. Investigated objects are glass standards and also prepared paint layers. Perspectives for other types of studies are proposed. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码：41 / 47
页数：7
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