A novel method for surface charge density measurement

被引：0
|
作者：
Zhang, P
Zhang, KX
机构：
来源：
IEEE 1996 ANNUAL REPORT - CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA, VOLS I & II | 1996年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper a new method for measuring surface charge density by means of Pockels effect and optic phase compensation is presented. Totally different from those current measuring methods, the prob(sic) of this new measuring device is made of Pockels crystal and the principle of the measurement is based on optic phase compensation. This prob(sic) brings much less disturbance to the surface charge density, especially, one on a conductor surface and the measuring result is easily obtained by readings of a volt meter.
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页码：113 / 116
页数：4
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