Overcoming Degradation Pathways to Achieve Stable Blue Perovskite Light-Emitting Diodes

被引:44
作者
Yuan, Shuai [1 ,2 ]
Zheng, Xiaopeng [3 ,4 ]
Shen, Wan-Shan [1 ]
Liu, Jiakai [3 ,5 ]
Cui, Lin-Song [2 ]
Zhang, Congcong [1 ]
Tian, Qi-Sheng [1 ]
Wu, Jun-Jie [1 ]
Zhou, Yu-Hang [1 ]
Wang, Xue-Dong [1 ]
Wang, Zhao-Kui [1 ]
Han, Peigang [5 ]
Luther, Joseph M. [4 ]
Bakr, Osman M. [3 ]
Liao, Liang-Sheng [1 ]
机构
[1] Soochow Univ, Inst Funct Nano & Soft Mat FUNSOM, Jiangsu Key Lab Carbon Based Funct Mat & Devices, Suzhou 215123, Jiangsu, Peoples R China
[2] Univ Sci & Technol China, Dept Polymer Sci & Engn, Hefei 230026, Anhui, Peoples R China
[3] King Abdullah Univ Sci & Technol KAUST, Div Phys Sci & Engn, Thuwal 239556900, Saudi Arabia
[4] Natl Renewable Energy Lab, Golden, CO 80401 USA
[5] Shenzhen Technol Univ, Coll New Mat & New Energies, Shenzhen 518118, Peoples R China
基金
中国国家自然科学基金; 国家重点研发计划;
关键词
MIXED-HALIDE PEROVSKITES; PHASE SEGREGATION; QUANTUM DOTS; NANOCRYSTALS; CSPBX3; BR;
D O I
10.1021/acsenergylett.2c00465
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Mixed halide (Br/Cl) perovskite nanocrystals(NCs) that represent an advanced blue emitter commonlysuffer from spectral instability and poor lifespan; notably, thelack of understanding of the failure mechanisms of thesedevices has restricted the future progress. Here, we determinethat the degradation of CsPbBrxCl3-xNCs containing bluelight-emitting diodes (LEDs) is due to the combination of twoeffects. Cl-drift among adjoining NCs under an electricfield isfound to induce a Cl-deficient material region in multiple NClayers, which dominates the unstable electroluminescence andcauses fast degradation in the corresponding devices. Incomparison, the monolayer NC devices that feature restricted anion drift pathways exhibit better operational stability;however, excess hole injection is demonstrated to induce irreversible chlorine loss in NCs. Such a process that largely arisesfrom electrochemical oxidation of Cl-initiates a mild device failure in operation of tens of minutes. Through revealing thesemechanisms, we modulate the devices'construction and operational conditions to achieve a longer lifespan.
引用
收藏
页码:1348 / 1354
页数:7
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