共 9 条
[1]
Detection of junction failures and other defects in silicon and III-V devices using the LBIC technique in lateral configuration
[J].
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY,
1996, 42 (1-3)
:208-212
[2]
AGOSTINELLI G, IN PRESS 17 ESPEC MU
[3]
AGOSTINELLI G, 1998, P 2 WCPEC VIENN AUST, P184
[4]
[Anonymous], 1998, 2 WORLD C PHOT EN CO
[5]
SPATIAL-MAPPING OF ELECTRICALLY ACTIVE DEFECTS IN HGCDTE USING LASER BEAM-INDUCED CURRENT
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1987, 5 (05)
:3186-3189
[6]
CARSTENSEN J, P 16 EPSEC, V2, P1627
[7]
PERNAU T, 2001, IN PRESS P 17 EPSEC
[8]
SANII F, 1988, P 20 IEEE PHOT SPEC, P575