Improving the test rate of power supply units

被引：0
|
作者：
Ferriter, T
机构：
来源：
ELECTRONIC ENGINEERING | 2000年 / 72卷 / 885期
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暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Technology advances in power supply test equipment hardware and software offer the opportunity to make significant improvements in test speed and accuracy. This article examines the issues which affect throughput in PSU (power supply unit) test, with special reference to a new test concept. Application examples are provided from leading power supply manufacturers to demonstrate the significant reduction in test time obtained using the new method in the form of a proprietry tool.
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页码：53 / +
页数：3
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