Cathodoluminescence and Hall-effect measurements in sulfur-doped chemical-vapor-deposited diamond

被引:26
|
作者
Nakazawa, K
Tachiki, M
Kawarada, H
Kawamura, A
Horiuchi, K
Ishikura, T
机构
[1] Waseda Univ, Sch Sci & Engn, Shinjuku Ku, Tokyo 1698555, Japan
[2] Japan Sci & Technol Corp, CREST, Chiyoda Ku, Tokyo 1020081, Japan
[3] Tokyo Gas Co Ltd, Dept Res & Dev, Frontier Res Inst, Tsurumi Ku, Yokohama, Kanagawa 2300045, Japan
关键词
D O I
10.1063/1.1563829
中图分类号
O59 [应用物理学];
学科分类号
摘要
Dominant n-type conductivity in sulfur-doped chemical-vapor-deposited diamond is observed by Hall-effect measurement. The activation energy is estimated at 0.5-0.75 eV above 600 K. Below 600 K, the carrier concentration deviates from the activation energy, and Hall mobility decreases in comparison with that above 600 K. It is considered that hopping conduction takes place. By cathodoluminescence measurement, free-exciton recombination radiation is observed in spite of a very high sulfur doping level of 2.5% during deposition, where boron is not detected by secondary ion mass spectroscopy. Therefore, the n-type conductivity of sulfur-doped diamond is caused by a sulfur-related mechanism. (C) 2003 American Institute of Physics.
引用
收藏
页码:2074 / 2076
页数:3
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