Efficient analysis and design strategies for radio frequency boards dedicated to integrity monitoring of integrated circuits using an electromagnetic/circuit co-design technique

被引:5
作者
Vande Ginste, D. [1 ]
Rogier, H. [1 ]
De Zutter, D. [1 ]
Pues, H. [2 ]
机构
[1] Univ Ghent, Electromagnet Grp, Dept Informat Technol, B-9000 Ghent, Belgium
[2] Melexis Tessenderlo NV, B-3980 Tessenderlo, Belgium
关键词
SUSCEPTIBILITY; DISTURBANCES; MODEL;
D O I
10.1049/iet-smt.2010.0032
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
At the moment a lot of attention is devoted to power integrity (PI), signal integrity (SI) and electromagnetic compatibility (EMC) of integrated circuits (ICs). For PI-, SI-and EMC-aware design, the modelling and characterisation of ICs is indispensable. Nevertheless, measuring the performance of ICs is not straightforward. Often, the behaviour of the IC-under-test is characterised by placing it on a radio frequency (RF)board and by performing measurements on the board. It was observed that this board often influences the characterisation of the IC. In this study the authors focus on efficient analysis and design strategies for reliable RF boards dedicated to integrity monitoring of ICs. The approach presented here is based on an EM/circuit co-design technique. The authors apply the technique to a canonical test board used for, among others, conducted susceptibility testing of ICs up to a frequency of 2.5 GHz. This is considered to be a relatively high frequency for conducted susceptibility testing of ICs, having the advantage of incorporating the important 2.45 GHz Industrial, Scientific and Medical band. Simulation results illustrate the novel techniques and demonstrate their validity and efficiency for analysis, deembedding and design purposes.
引用
收藏
页码:268 / 277
页数:10
相关论文
共 19 条
[1]  
Alaeldine A, 2007, EMC ZURICH-MUNICH 2007, SYMPOSIUM DIGEST, P79
[2]   A direct power injection model for immunity prediction in integrated circuits [J].
Alaeldine, Ali ;
Perdriau, Richard ;
Ramdani, Mohamed ;
Levant, Jean-Luc ;
Drissi, M'hamed .
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 2008, 50 (01) :52-62
[3]  
[Anonymous], 2007, GENERIC IC EMC TEST, P2004
[4]   PEEC capacitance extraction of 3-D interconnects [J].
Antonini, G. .
IET SCIENCE MEASUREMENT & TECHNOLOGY, 2007, 1 (04) :201-209
[5]  
Ben Dhia S, 2006, ELECTROMAGNETIC COMPATIBILITY OF INTEGRATED CIRCUITS: TECHNIQUES FOR LOW EMISSION AND SUSCEPTIBILITY, P1
[6]   Enhancement of accuracy for measuring the susceptibility of integrated circuits to conducted electromagnetic disturbances [J].
Chahine, I. ;
Kadi, M. ;
Gaboriaud, E. ;
Gallenne, X. ;
Louis, A. ;
Mazari, B. .
IET SCIENCE MEASUREMENT & TECHNOLOGY, 2007, 1 (05) :240-244
[7]   Modelling of integrated circuit susceptibility to conducted electromagnetic disturbances using neural networks theory [J].
Chahine, I. ;
Kadi, M. ;
Gaboriaud, E. ;
Maziere, C. ;
Louis, A. ;
Mazari, B. .
ELECTRONICS LETTERS, 2006, 42 (18) :1022-1024
[8]   Characterization and Modeling of the Susceptibility of Integrated Circuits to Conducted Electromagnetic Disturbances Up to 1 GHz [J].
Chahine, Imad ;
Kadi, Moncef ;
Gaboriaud, Eric ;
Louis, Anne ;
Mazari, Belahcene .
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 2008, 50 (02) :285-293
[9]   Recent trends in the integration of circuit optimization and full-wave electromagnetic analysis [J].
De Zutter, D ;
Sercu, J ;
Dhaene, T ;
De Geest, J ;
Demuynck, FJ ;
Hammadi, S ;
Huang, CWP .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2004, 52 (01) :245-256
[10]  
Goedbloed Jasper P, 1992, Electromagnetic Compatibility