Continuous-tone grayscale mask fabrication using high-energy-beam-sensitive glass

被引:19
作者
Dillon, T [1 ]
Sure, A [1 ]
Murakowski, J [1 ]
Prather, D [1 ]
机构
[1] Univ Delaware, Dept Elect & Comp Engn, Newark, DE 19716 USA
来源
JOURNAL OF MICROLITHOGRAPHY MICROFABRICATION AND MICROSYSTEMS | 2004年 / 3卷 / 04期
关键词
high-energy-beam-sensitive glass; grayscale mask writing; grayscale lithography; proximity effect; retroreflector;
D O I
10.1117/1.1793156
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
For highest efficiency optical devices, it is desirable to form continuously graded device features. We describe a technique to produce such features through the fabrication of a continuous-tone grayscale mask and subsequent grayscale photolithography. The design of the mask fabrication process is outlined, including the high-energy-beam-sensitive (HEBS) glass electron-beam exposure response characterization, and the generation of an exposure profile with inherent proximity effect correction. Application of the process is demonstrated through fabrication of smooth-facet retroreflectors, with features that are not possible to produce either by a grayscale process that employs discreet gray levels or by anisotropic wet etch techniques. (C) 2004 Society of Photo-Optical Instrumentation Engineers.
引用
收藏
页码:550 / 554
页数:5
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