The electro-thermal smoothie database model for LDMOS devices

被引：6

作者：

Cuoco, V ^{[1
]}

Neo, WCE ^{[1
]}

Spirito, M ^{[1
]}

Yanson, O ^{[1
]}

Nenadovic, N ^{[1
]}

de Vreede, LCN ^{[1
]}

Jos, HFF ^{[1
]}

Burghartz, JN ^{[1
]}

机构：

[1] Delft Univ Technol, Delft, Netherlands

来源：

ESSDERC 2004: PROCEEDINGS OF THE 34TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE | 2004年

关键词：

D O I：

10.1109/ESSDER.2004.1356590

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper we present the electro-thermal (ET) extension of the Smoothie database model for LDMOS devices together with its experimental verification. For the DC verification, the drain current was measured both in continuous mode and under isothermal conditions at different temperatures. In the RF large-signal verification, we used realistic loading conditions for the LDMOS devices while providing two-tone as well as IS-95 CDMA test conditions. With the aid of the above, thermal memory effects were studied by monitoring the device linearity versus tone spacing. In all the experiments, Smoothie demonstrated an excellent agreement with the measured results.

引用

页码：457 / 460

页数：4