Effect of ZnO loading on the electrical characteristics of graphene oxide-ZnO based thin film transistors
被引:0
作者:
Jilani, S. Mahaboob
论文数: 0引用数: 0
h-index: 0
机构:
Indian Inst Technol, Ctr Mat Sci, Kharagpur 721320, W Bengal, IndiaIndian Inst Technol, Ctr Mat Sci, Kharagpur 721320, W Bengal, India
Jilani, S. Mahaboob
[1
]
Banerji, P.
论文数: 0引用数: 0
h-index: 0
机构:
Indian Inst Technol, Ctr Mat Sci, Kharagpur 721320, W Bengal, IndiaIndian Inst Technol, Ctr Mat Sci, Kharagpur 721320, W Bengal, India
Banerji, P.
[1
]
机构:
[1] Indian Inst Technol, Ctr Mat Sci, Kharagpur 721320, W Bengal, India
来源:
PHYSICS OF SEMICONDUCTOR DEVICES
|
2014年
关键词:
TFT;
graphene oxide;
ZnO;
composite;
D O I:
10.1007/978-3-319-03002-9_156
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
Reduced graphene oxide based composites filled with metal oxide nanoparticles are emerging as active materials in transistor applications. Here we report fabrication of transistors on poly methyl methacrylate (PMMA) dielectric using graphene oxide-ZnO nanocomposite as channel layer with 5 wt% ZnO nanorods were loaded in graphene oxide. The transistors showed ambipolar conductivity with the value of hole and electron mobility as 0.74 and 0.67 cm(2)/V.s, respectively, on PMMA dielectric. This indicates that percolation threshold could not be achieved with 5% ZnO though the low concentration of ZnO reduces the GO partially and the n-type conductivity slightly increases compared to the thermally or chemically reduced GO based TFTs.